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MIL-PRF-19500-759 Revision A:2012

Current
Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) DUAL TRANSISTOR, N-CHANNEL AND P-CHANNEL, LOGIC-LEVEL SILICON TYPES 2N7632UD, JANTXVR, F, AND JANSR, F
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PDF

1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES

Describes the performance requirements for dual N-channel and P-channel, enhancement-mode, low-threshold logic level, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor.

Committee
FSC 5961
DevelopmentNote
A NOTICE 1 - Notice of Validation. (11/2016) NEW CHILD NOT 2 2021 IS NOW ADDED.
DocumentType
Standard
Pages
23
ProductNote
NEW CHILD NOT 2 2021 IS NOW ADDED.
PublisherName
US Military Specs/Standards/Handbooks
Status
Current

MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES

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