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NASA JSC HDBK 07-001 : 2012

Current

Current

The latest, up-to-date edition.

HIGH ENERGY/LET RADIATION EEE PARTS CERTIFICATION HANDBOOK

Published date

01-01-2012

1.0 SCOPE
2.0 REFERENCES
3.0 ACRONYMS, TERMS, AND DEFINITIONS
4.0 SPACE RADIATION ENVIRONMENT
5.0 GENERAL DESIGN CONSIDERATIONS
6.0 POTENTIAL EFFECTS OF RADIATION ON ELECTRONICS
7.0 FURTHER CONSIDERATIONS
7.0 FURTHER CONSIDERATIONS
8.0 NSRL FACILITY AND TESTING CAPABILITIES
9.0 PART RADIATION CHARACTERIZATION FROM VDBP
10.0 POTENTIAL ISSUES
11.0 VDBP GENERIC RUN PROCEDURE
12.0 JSC REAL TIME ANALYSIS SOFTWARE
13.0 SUMMARY
APPENDIX A - ACRONYM LIST
APPENDIX B - INFORMATIVE REFERENCES

Specifies an overview of the VDBP method and to provide test procedure guidelines to the user who chooses to implement this method over traditional heavy ion methods.

DevelopmentNote
Expiration Date: 22-03-2017. (07/2012)
DocumentType
Standard
PublisherName
National Aeronautics and Space Administration
Status
Current

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES

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