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NEN EN IEC 60512-6-2 : 2002

Current
Current

The latest, up-to-date edition.

CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 6-2: DYNAMIC STRESS TESTS - TEST 6B: BUMP
Published date

01-12-2013

Defines a standard test method to assess the ability of components to withstand specified severities of bump.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
EN 60512-6-2:2002 Identical
IEC 60512-6-2:2002 Identical

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