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NEN EN IEC 61163-1 : 2007

Current

Current

The latest, up-to-date edition.

RELIABILITY STRESS SCREENING - PART 1: REPAIRABLE STRESS SCREENING IN LOTS

Published date

01-12-2013

Explains particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.

DevelopmentNote
Supersedes NEN IEC 61163-1 and NEN 11163-1. (01/2008)
DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current
Supersedes

Standards Relationship
EN 61163-1 : 2006 Identical
IEC 61163-1:2006 Identical

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