NEN EN IEC 62132-3 : 2007
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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY, 150 KHZ TO 1 GHZ - PART 3: BULK CURRENT INJECTION (BCI) METHOD
Published date
01-12-2013
Publisher
Explains a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances.
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