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SAE AS 6171/3 : 2016

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY X-RAY FLUORESCENCE TEST METHODS
Available format(s)

Hardcopy , PDF

Superseded date

03-04-2024

Language(s)

English

Published date

10-30-2016

Publisher

SAE International

1. SCOPE
2. REFERENCES
3. DESCRIPTION OF METHODOLOGY/PROCEDURE
4. TEST EQUIPMENT AND CALIBRATION
5. REQUIREMENTS
6. NOTES

Gives information and instructions on how to use XRF as a technique to verify the materials and finishes of EEE parts to compare with the original design, construction and material requirements.

Committee
G-19A
DocumentType
Test Method
Pages
22
PublisherName
SAE International
Status
Superseded
SupersededBy

18/30373170 DC : 0 BS EN 62668-2 - PROCESS MANAGEMENT FOR AVIONICS - COUNTERFEIT PREVENTION - PART 2: MANAGING ELECTRONIC COMPONENTS FROM NON-FRANCHISED SOURCES
SAE AS 6171 : 2016 TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS
IEC TS 62668-2:2016 Process management for avionics - Counterfeit prevention - Part 2: Managing electronic components from non-franchised sources
PD IEC/TS 62668-2:2016 Process management for avionics. Counterfeit prevention Managing electronic components from non-franchised sources

ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
SAE AS 5553B : 2016 COUNTERFEIT ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS; AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION
SAE AS 6171 : 2016 TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS
NAS410:2003 NAS CERTIFICATION & QUALIFICATION OF NONDESTRUCTIVE TEST PERSONNEL
ISO 3497:2000 Metallic coatings Measurement of coating thickness X-ray spectrometric methods
MIL-STD-1580 Revision B:2003 DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS
MIL-PRF-38535 Revision K:2013 Integrated Circuits (Microcircuits) Manufacturing, General Specification for

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PDF - English
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