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SAE AS 6171/4 : 2016

SAE AS 6171/4 : 2016

Current

Current

The latest, up-to-date edition.

TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DELID/DECAPSULATION PHYSICAL ANALYSIS TEST METHODS

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

10-30-2016

Publisher

SAE International

1. SCOPE
2. REFERENCES
3. DESCRIPTION OF THE METHODOLOGY/PROCEDURE - MICROCIRCUITS,
   HYBRIDS, DIODES, AND TRANSISTORS
4. DESCRIPTION OF THE PROCEDURE - RESISTORS, CAPACITORS,
   INDUCTORS, FILTERS, CONNECTORS, CABLES, FUSES, TRANSFORMERS
   (PASSIVE DEVICES)
5. TEST EQUIPMENT, TEST SAMPLES, AND CALIBRATION
6. DETAILED REQUIREMENTS
7. ALTERNATE PACKAGE/MATERIAL TYPES
8. NOTES
APPENDIX A - DECAPSULATION AND PHOTO-DOCUMENTATION EXAMPLES
APPENDIX B - VISUAL ANOMALY EXAMPLES
APPENDIX C - UNACCEPTABLE DECAPSULATION RESULTS
APPENDIX D - PROFICIENCY SAMPLE QUESTIONS (FOR INTERNAL USE ONLY)

Regulates inspection, test procedures and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) components or parts utilizing Delid/Decapsulation Physical Analysis.

Committee
G-19A
DocumentType
Test Method
Pages
36
PublisherName
SAE International
Status
Current

18/30373170 DC : 0 BS EN 62668-2 - PROCESS MANAGEMENT FOR AVIONICS - COUNTERFEIT PREVENTION - PART 2: MANAGING ELECTRONIC COMPONENTS FROM NON-FRANCHISED SOURCES
SAE AS 6171/11 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DESIGN RECOVERY TEST METHODS
IEC TS 62668-2:2016 Process management for avionics - Counterfeit prevention - Part 2: Managing electronic components from non-franchised sources
SAE AS 6171 : 2016 TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS
PD IEC/TS 62668-2:2016 Process management for avionics. Counterfeit prevention Managing electronic components from non-franchised sources

SAE AS 6171 : 2016 TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS
MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
SAE AS 6171/5 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS
MIL-STD-1580 Revision B:2003 DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS

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Hardcopy - English
PDF - English
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