PREFACE
1.0 INTRODUCTION
1.1 Application of Document
1.2 Devices Covered
1.3 Quality Levels
1.4 Organization of Document
1.5 Major Changes From TA-TSY-000468
1.6 Requirements Terminology
1.7 Announcements of Anticipated Changes and Additions
2.0 BASIC RELIABILITY PROGRAM REQUIREMENTS
2.1 Overview of Reliability Assurance
2.2 Vendor and Device Qualification
2.3 Lot-To-Lot Quality and Reliability Controls
2.4 Feedback and Corrective Action
2.5 Device Storage and Handling
2.6 Documentation and Test Data
2.7 Other Considerations
3.0 LASER RELIABILITY AND QUALITY REQUIREMENTS
3.1 Laser Diode Qualification
3.2 Laser Diodes Lot-To-Lot Controls
3.3 Laser Module Qualification
3.4 Laser Modules Lot-To-Lot Controls
3.5 Qualification of Integrated Laser Module
3.6 Integrated Laser Module Lot-To-Lot Controls
3.7 Qualification of Other Component Parts
3.8 Lot-To-Lot Controls of Other Component Parts
4.0 SPECIAL PROCEDURES AND TEST METHODS FOR LASERS
4.1 Wavelength and Spectral Width
4.2 Far-Field Pattern
4.3 Threshold Current
4.4 Threshold Current Temperature Sensitivity
4.5 Linearity of the L-I Curve
4.6 Voltage-Current Curve
4.7 Modulation Depth
4.8 Rise and Fall Times
4.9 Turn-On Delay
4.10 Cutoff Frequency
4.11 Self-Pulsation
4.12 Monitor Operation
4.13 Thermoelectric Cooler and Temperature Sensor Checks
4.14 Coupling Efficiency
4.15 Front-To-Rear Tracking Ratio
4.16 Front-To-Rear Tracking Error
4.17 Thermal Impedance
4.18 Accelerated Aging
4.19 Reliability Calculations
4.20 Temperature Cycling
4.21 Damp Heat (Steady State)
4.22 ESD Threshold
5.0 LED RELIABILITY AND QUALITY REQUIREMENTS
5.1 LED Qualification
5.2 LED Lot-To-Lot Controls
5.3 LED Module Qualification
5.4 LED Modules Lot-To-Lot Controls
5.5 Qualification of Integrated LED Module
5.6 Integrated LED Module Lot-To-Lot Controls
5.7 Qualification of Other Component Parts
5.8 Lot-To-Lot Controls of Other Component Parts
6.0 SPECIAL PROCEDURES AND TEST METHODS FOR LEDS
6.1 Wavelength and Spectral Width
6.2 LED Light-Current Curve
6.3 Modulation Depth
6.4 Rise and Fall Times
6.5 Turn-On Delay
6.6 Cutoff Frequency
6.7 Thermoelectric Cooler and Temperature Sensor Checks
6.8 Accelerated Aging
6.9 Temperature Cycling
6.10 Damp Heat (Steady State)
6.11 Endurance Test for Other Components
6.12 Reliability Calculations
6.13 ESD Threshold
7.0 PHOTODETECTORS RELIABILITY AND QUALITY REQUIREMENTS
7.1 Photodiode Qualifications
7.2 Photodiode Lot-To-Lot Control
7.3 Detector Module Qualification
7.4 Detector Modules Lot-To-Lot Controls
7.5 Qualification of Integrated Detector Module
7.6 Integrated Detector Module Lot-To-Lot Controls
7.7 Qualification of Other Component Parts
7.8 Lot-To-Lot Controls of Other Component Parts
8.0 SPECIAL PROCEDURES AND TEST METHODS FOR
           PHOTODETECTORS
8.1 Responsivity of Photodetectors
8.2 Photodetector Quantum Efficiency
8.3 Photodetector Linearity and Gain
8.4 Dark Current
8.5 Capacitance
8.6 Breakdown Voltage
8.7 Excess Noise Factor
8.8 Cutoff Frequency
8.9 Thermoelectric Cooler and Temperature Sensor Checks
8.10 Thermal Impedance
8.11 Accelerated Aging Life Test (Photodiodes and
           Detector Modules)
8.12 Temperature Cycling
8.13 Damp Heat (Steady State)
8.14 Endurance Test for Other Components
8.15 Reliability Calculations
8.16 ESD Threshold
9.0 RELATED DOCUMENTS
9.1 Bellcore Documents
9.2 Military Documents
9.3 IEC Documents
10.0 GLOSSARY
10.1 Symbols, Acronyms and Units
10.2 Terms
List of Figures
Figure 1-1. Schematic of a Common Laser Module Design
Figure 2-1. Elements of a Comprehensive Reliability
              Assurance Program
Figure 4-1. Example of a Single-Mode Laser Optical
              Spectrum
Figure 4-2. Laser Far Field Pattern Measurement
Figure 4-3. Example of L-I and dL/dI Curves With a Kink
Figure 4-4. Measurement of Rise and Fall Times
Figure 4-5. Measurement of Turn-On Delay
Figure 4-6. Example of a Lognormal Probability Plot
Figure 4-7. Goldthwaite Curves
Figure 4-8. Nomograph for Calculating Random Failure
              Rates
Figure 8-1. Example of Photodetector Linearity
Figure 8-2. Example of an APD Gain Profile
List of Tables
Table 1-1. Definition of Quality Levels
Table 3-1. Characterization of Laser Diodes
Table 3-2. Reliability Tests for Laser Diodes
Table 3-3. Lot Controls - Laser Diode Electrical and
              Optical Tests
Table 3-4. Characterization of Laser Modules
Table 3-5. Reliability Tests for Laser Modules
Table 3-6. Lot Controls - Laser Module Electrical and
              Optical Tests
Table 4-1. Sample Format for Reporting Reliability
              Information
Table 5-1. Characterization of LEDs
Table 5-2. Reliability Tests for LEDs
Table 5-3. Lot Controls - LED Electrical and Optical
              Tests
Table 5-4. Characterization of LED Modules
Table 5-5. Reliability Tests for LED Modules
Table 5-6. Lot Controls - LED Module Electrical and
              Optical Tests
Table 7-1. Characterization of Photodiodes
Table 7-2. Reliability Tests for Photodiodes
Table 7-3. Lot Controls - Photodiode Electrical and Optical
              Tests
Table 7-4. Characterization of Detector Modules
Table 7-5. Reliability Tests for Detector Modules
Table 7-6. Lot Controls - Detector Module Electrical and
              Optical Tests