1 - AS 2879.7-1997 ALUMINA - DETERMINATION OF TRACE ELEMENTS - WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRIC METHOD
4 - PREFACE
5 - CONTENTS
6 - 1 SCOPE
6 - 2 REFERENCED DOCUMENTS
7 - 3 PRINCIPLE
7 - 4 REAGENTS AND MATERIALS
7 - 4.1 Flux
7 - 4.2 Aluminium oxide
7 - 4.3 Sodium tetraborate
7 - 4.4 Silicon dioxide
7 - 4.5 Iron( III) oxide
7 - 4.6 Calcium carbonate
7 - 4.7 Titanium dioxide
7 - 4.8 Ammonium dihydrogen orthophosphate
7 - 4.9 Vanadium pentoxide
7 - 4.10 Zinc oxide
8 - 4.11 Manganese oxide
8 - 4.12 Gallium oxide
8 - 4.13 Potassium carbonate
8 - 4.14 Copper oxide
8 - 4.15 Chromium( III) oxide
8 - 4.16 Nickel( II) oxide (NiO),
8 - 5 APPARATUS
8 - 5.1 Crucible
8 - 5.2 Desiccator
8 - 5.3 Electric furnace
8 - 5.4 Mould
8 - 5.5 X-ray fluorescence spectrometer
8 - 5.6 Vibratory mill
8 - 5.7 Fusion equipment
8 - 6 SAMPLING AND SAMPLES
9 - 7 PROCEDURE
9 - 7.1 General
9 - 7.2 Preparation of calibration specimens
12 - 7.3 Preparation of sample
13 - 7.4 X-ray fluorescence measurement
15 - 8 CALCULATIONS
15 - 8.1 General
15 - 8.2 Calculation of net intensity
15 - 8.3 Comparison of duplicate measurements for the Al2O3 blanks and SCDs
16 - 8.4 Drift correction of measured intensities
16 - 8.5 Calculation of the calibration parameters
16 - 9 REPORTING OF RESULTS
17 - 10 PRECISION
17 - 11 TEST REPORT
18 - APPENDIX A - MINIMIZATION OF CONTAMINATION AND CARE OF PLATINUM WARE
18 - A1 REAGENTS AND INSTRUMENT
18 - A2 PLATINUM WARE
18 - A3 BLANK
19 - APPENDIX B - EXAMPLE OF INSTRUMENT OPTIMIZATION
19 - B1 SCOPE
19 - B2 COUNTING STRATEGY
20 - B3 SPECTRAL INTERFERENCE
25 - APPENDIX C - CALCULATION OF REAGENT MASSES FOR DIFFERENT SAMPLE/FLUX COMBINATIONS AND SCDs OMITTING SOME ELEMENTS
26 - APPENDIX D - PREPARATION OF A MONITOR DISC
27 - APPENDIX E INTERLABORATORY TEST PROGRAM ANALYSIS OF NBS 699, REDUCTION-GRADE ALUMINA, STANDARD REFERENCE MATERIAL

Sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorous, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel, expressed as the oxides on an as-received basis.

This Standard sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel (expressed as the oxides Na2O, SiO2, Fe2O3, CaO, TiO2, P2O5, V2O5, ZnO, MnO, Ga2O3, K2O, CuO, Cr2O3and NiO on an as-received basis).The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each of the components is given in Table 1.

First published as AS 2879.7-1997.Reconfirmed 2013. First published as AS 2879.7-1997.