ASTM B 878 : 1997 : R2019
Current
The latest, up-to-date edition.
Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
Hardcopy , PDF
English
04-14-2023
1.1This test method describes equipment and techniques for detecting contact resistance transients yielding resistances greater than a specified value and lasting for at least a specified minimum duration.
1.2The minimum durations specified in this standard are 1, 10, and 50 nanoseconds (ns).
1.3The minimum sample resistance required for an event detection in this standard is 10 Ω.
1.4An ASTM guide for measuring electrical contact transients of various durations is available as Guide B854.
1.5The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.6This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to become familiar with all hazards including those identified in the appropriate Material Safety Data Sheet (MSDS) for this product/material as provided by the manufacturer, to establish appropriate safety, health, and environmental practices, and determine the applicability of regulatory limitations prior to use.
1.7This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
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