• There are no items in your cart

ASTM E 996 : 2019

Current
Current

The latest, up-to-date edition.

Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

04-01-2019

Auger and X-ray photoelectron spectra are obtained using a variety of excitation methods, analyzers, signal processing, and digitizing techniques.

1.1Auger and X-ray photoelectron spectra are obtained using a variety of excitation methods, analyzers, signal processing, and digitizing techniques.

1.2This practice lists the desirable information that shall be reported to fully describe the experimental conditions, specimen conditions, data recording procedures, and data transformation processes.

1.3The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.4This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.5This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Committee
E 42
DocumentType
Standard Practice
Pages
3
PublisherName
American Society for Testing and Materials
Status
Current
Supersedes

ASTM E 1127 : 1991 : R1997 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM E 1078 : 2002 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
ASTM E 1078 : 1997 Standard Guide for Procedures for Specimen Preparation and Mounting in Surface Analysis
ASTM E 1127 : 2008 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM E 1127 : 2008 : R2015 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM E 1078 : 2014 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
ASTM E 1127 : 2003 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM E 1078 : 2009 Standard Guide for Specimen Preparation and Mounting in Surface Analysis

View more information
US$55.00
Excluding Tax where applicable

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.