ASTM F 419 : 1994
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)
Hardcopy , PDF
12-31-2001
English
01-01-1994
CONTAINED IN VOL. 10.05, 2001 Measures net carrier density in silicon epitaxial layers. Precision depends upon carrier density inhomogeneities parallel and perpendicular to junction and upon carrier density level.
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