• BS 3934(1965) : 1965

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    SPECIFICATION FOR DIMENSIONS OF SEMICONDUCTOR DEVICES AND INTEGRATED ELECTRONIC CIRCUITS

    Available format(s):  Hardcopy, PDF

    Superseded date:  04-01-1992

    Language(s):  English

    Published date:  01-01-1965

    Publisher:  British Standards Institution

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    Abstract - (Show below) - (Hide below)

    Records drawing of outlines, bases and gauges of various forms of semiconductor device integrated circuit. Guidance on the interpretation and use if the drawings is given.

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS QC 750005:1987 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - VOLTAGE-REGULATOR DIODES AND VOLTAGE-REFERENCE DIODES, EXCLUDING TEMPERATURE-COMPENSATED PRECISION REFERENCE DIODES
    BS EN 150007:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: CASE RATED BIPOLAR TRANSISTORS FOR HIGH FREQUENCY AMPLIFICATION
    BS EN 120006:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: PIN-PHOTODIODES FOR FIBRE OPTIC APPLICATIONS
    BS G 209:1970 Specification for transformer rectifier units
    BS EN 150003:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: CASE-RATED BIPOLAR TRANSISTORS FOR LOW FREQUENCY AMPLIFICATION
    BS QC 750001:1986 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - SIGNAL DIODES, SWITCHING DIODES AND CONTROLLED AVALANCHE DIODES
    BS 9305 N001:1972 DETAIL SPECIFICATION FOR SILICON VOLTAGE REGULATOR DIODES - 1.5 W, 3.3 TO 33 V (5%), HERMETICALLY SEALED - GENERAL APPLICATION CATEGORY Q
    BS QC 750103:1990 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - CASE-RATED BIPOLAR TRANSISTORS FOR LOW-FREQUENCY AMPLIFICATION
    BS 9301 N002:1971 DETAIL SPECIFICATION FOR GENERAL PURPOSE SILICON SIGNAL DIODES - 150 MA, 150 V, HERMETICALLY SEALED, GLASS ENCAPSULATION - GENERAL APPLICATION CATEGORY Q
    BS EN 150011:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: CASE-RATED THYRISTORS
    BS 9364 N016:1979 DETAIL SPECIFICATION FOR LOW POWER SILICON N-P-N SWITCHING TRANSISTORS - 65 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION - FULL PLUS ADDITIONAL ASSESSMENT LEVEL
    BS CECC 90000:1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: MONOLITHIC INTEGRATED CIRCUITS
    BS CECC 20000:1983 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: SEMICONDUCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES
    BS CECC 90000:1985 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: MONOLITHIC INTEGRATED CIRCUITS
    BS 9305 N041:1972 DETAIL SPECIFICATION FOR SILICON VOLTAGE REGULATOR DIODES - 400 MW, 2.7 TO 33 V (5%), HERMETICALLY SEALED, GLASS ENCAPSULATION - GENERAL APPLICATION CATEGORY Q
    BS CECC 90104:1981 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION: C - MOS DIGITAL INTEGRATED CIRCUITS, SERIES 4000B AND 4000UB
    BS EN 150012:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - SINGLE GATE FIELD-EFFECT TRANSISTORS
    BS QC 750110:1990 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - REVERSE BLOCKING TRIODE THYRISTORS, AMBIENT AND CASE-RATED, UP TO 100 A
    BS EN 120002:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: INFRARED EMITTING DIODES, INFRARED EMITTING DIODE ARRAYS
    BS 9364 N017:1979 DETAIL SPECIFICATION FOR LOW POWER SILICON N-P-N SWITCHING TRANSISTORS - 65 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION (LONG LEAD VERSION) - FULL PLUS ADDITIONAL ASSESSMENT LEVEL
    BS QC 750107:1991 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - CASE-RATED BIPOLAR TRANSISTORS FOR HIGH-FREQUENCY AMPLIFICATIONS
    BS EN 150010:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: AMBIENT RATED THYRISTORS
    BS CECC 50008:1982 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: AMBIENT-RATED RECTIFIER DIODES
    BS EN 120003:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - PHOTOTRANSISTORS, PHOTODARLINGTON TRANSISTORS, PHOTOTRANSISTOR ARRAYS
    BS 6493-1.1:1984 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - GENERAL
    BS CECC 63000:1990 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: FILM AND HYBRID INTEGRATED CIRCUITS
    BS CECC 90103:1983 Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS
    BS CECC 50000:1987 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: DISCRETE SEMICONDUCTOR DEVICES
    BS 9450:1998 SPECIFICATION FOR INTEGRATED ELECTRONIC CIRCUITS AND MICRO-ASSEMBLIES OF ASSESSED QUALITY (CAPABILITY APPROVAL PROCEDURES) - GENERIC DATA AND METHODS OF TEST
    BS CECC 90104:1990 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION: C - MOS DIGITAL INTEGRATED CIRCUITS SERIES 4000 B AND 4000 UB
    BS 9364 N013:1979 DETAIL SPECIFICATION FOR LOW POWER SILICON P-N-P SWITCHING TRANSISTORS - 25 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION - FULL PLUS ADDITIONAL ASSESSMENT LEVEL
    BS EN 150004:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: BIPOLAR TRANSISTORS FOR SWITCHING APPLICATIONS
    BS 6943:1988 CLASSIFICATION OF SHAPES OF ELECTRONIC COMPONENTS FOR PLACEMENT ON PRINTED WIRING BOARDS
    BS EN 150013:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: CURRENT REGULATOR AND CURRENT REFERENCE DIODES
    BS QC 750108:1990 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - RECTIFIER DIODES (INCLUDING AVALANCHE RECTIFIER DIODES), AMBIENT AND CASE-RATED, UP TO 100 A
    BS 9364 N008 and N010:1978 DETAIL SPECIFICATION FOR LOW POWER SILICON N-P-N SWITCHING TRANSISTORS - 20 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION (LONG LEAD VERSION) - FULL PLUS ADDITIONAL ASSESSMENT LEVEL
    BS EN 120000:1996 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERAL SPECIFICATION: SEMICONDUCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES
    BS 9400(1970) : 1970 AMD 7224 SPECIFICATION FOR INTEGRATED ELECTRONIC CIRCUITS AND MICRO ASSEMBLIES OF ASSESSED QUALITY (QUALIFICATION APPROVAL PROCEDURES): GENERIC DATA AND METHODS OF TEST
    BS 9300:1969 SPECIFICATION FOR SEMICONDUCTOR DEVICES OF ASSESSED QUALITY: GENERIC DATA AND METHODS OF TEST
    BS CECC 90103:1980 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION - DIGITAL INTEGRATED TTL LOW POWER SCHOTTKY CIRCUITS SERIES 54LS, 64LS, 74LS, 84LS
    BS EN 150006:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - VARIABLE CAPACITANCE DIODE(S)
    BS EN 120005:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - PHOTODIODES, PHOTODIODE-ARRAYS (NOT INTENDED FOR FIBRE OPTIC APPLICATIONS)
    BS EN 150001:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: GENERAL PURPOSE SEMICONDUCTOR DIODES
    BS QC 750112:1988
    BS E9375:1975 SPECIFICATION - HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: VOLTAGE REGULATOR DIODES AND VOLTAGE REFERENCE DIODES EXCLUDING PRECISION-VOLTAGE TEMPERATURE-COMPENSATED REFERENCE DIODES
    BS 9305 N042:1972 DETAIL SPECIFICATION FOR SILICON VOLTAGE REGULATOR DIODES - 1.5 W, 6.8 TO 200 V (5%), HERMETICALLY SEALED - GENERAL APPLICATION CATEGORY C
    BS 9364 N007 and N009:1978 DETAIL SPECIFICATION FOR LOW POWER SILICON N-P-N SWITCHING TRANSISTORS - 20 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION - FULL PLUS ADDITIONAL ASSESSMENT LEVEL
    BS QC 760000:1990 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FILM AND HYBRID FILM INTEGRATED CIRCUITS - GENERIC SPECIFICATION
    BS EN 120004:1993 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - AMBIENT RATED PHOTOCOUPLERS WITH PHOTOTRANSISTOR OUTPUT
    BS 9450:1975 SPECIFICATION FOR INTEGRATED ELECTRONIC CIRCUITS AND MICRO-ASSEMBLIES OF ASSESSED QUALITY (CAPABILITY APPROVAL PROCEDURES): GENERIC DATA AND METHODS OF TEST
    BS CECC 90101:1980 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION: DIGITAL INTEGRATED TTL CIRCUITS, SERIES 54, 64, 74, 84
    BS QC 750102:1990 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - AMBIENT-RATED BIPOLAR TRANSISTORS FOR LOW AND HIGH-FREQUENCY AMPLIFICATION
    BS CECC 50009:1982 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes
    BS 9305 N044:1974 DETAIL SPECIFICATION FOR SILICON VOLTAGE REGULATOR DIODES - 1.0 W, 3.3 TO 33 V (5%), HERMETICALLY SEALED - FULL ASSESSMENT LEVEL
    BS 9364 N012:1978 DETAIL SPECIFICATION FOR LOW POWER SILICON P-N-P SWITCHING TRANSISTORS - 65 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION (LONG LEAD VERSION) - FULL PLUS ADDITIONAL ASSESSMENT LEVEL
    BS 9364 N011:1978 DETAIL SPECIFICATION FOR LOW POWER SILICON P-N-P SWITCHING TRANSISTORS - 65 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION - FULL PLUS ADDITIONAL ASSESSMENT LEVEL
    BS EN 190000:1996 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: MONOLITHIC INTEGRATED CIRCUITS
    BS E9372:1976 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: AMBIENT-RATED BIPOLAR TRANSISTORS FOR LOW AND HIGH FREQUENCY AMPLIFICATION
    EN 190000:1995 Generic Specification: Monolithic integrated circuits
    EN 150012 : 1991 Blank Detail Specification: Single gate field-effect transistors
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