BS QC 750005:1987
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - VOLTAGE-REGULATOR DIODES AND VOLTAGE-REFERENCE DIODES, EXCLUDING TEMPERATURE-COMPENSATED PRECISION REFERENCE DIODES |
BS EN 150007:1993
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: CASE RATED BIPOLAR TRANSISTORS FOR HIGH FREQUENCY AMPLIFICATION |
BS EN 120006:1993
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: PIN-PHOTODIODES FOR FIBRE OPTIC APPLICATIONS |
BS G 209:1970
|
Specification for transformer rectifier units |
BS EN 150003:1993
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: CASE-RATED BIPOLAR TRANSISTORS FOR LOW FREQUENCY AMPLIFICATION |
BS QC 750001:1986
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - SIGNAL DIODES, SWITCHING DIODES AND CONTROLLED AVALANCHE DIODES |
BS 9305 N001:1972
|
DETAIL SPECIFICATION FOR SILICON VOLTAGE REGULATOR DIODES - 1.5 W, 3.3 TO 33 V (5%), HERMETICALLY SEALED - GENERAL APPLICATION CATEGORY Q |
BS QC 750103:1990
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - CASE-RATED BIPOLAR TRANSISTORS FOR LOW-FREQUENCY AMPLIFICATION |
BS 9301 N002:1971
|
DETAIL SPECIFICATION FOR GENERAL PURPOSE SILICON SIGNAL DIODES - 150 MA, 150 V, HERMETICALLY SEALED, GLASS ENCAPSULATION - GENERAL APPLICATION CATEGORY Q |
BS EN 150011:1993
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: CASE-RATED THYRISTORS |
BS 9364 N016:1979
|
DETAIL SPECIFICATION FOR LOW POWER SILICON N-P-N SWITCHING TRANSISTORS - 65 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION - FULL PLUS ADDITIONAL ASSESSMENT LEVEL |
BS CECC 90000:1991
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: MONOLITHIC INTEGRATED CIRCUITS |
BS CECC 20000:1983
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: SEMICONDUCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES |
BS CECC 90000:1985
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: MONOLITHIC INTEGRATED CIRCUITS |
BS 9305 N041:1972
|
DETAIL SPECIFICATION FOR SILICON VOLTAGE REGULATOR DIODES - 400 MW, 2.7 TO 33 V (5%), HERMETICALLY SEALED, GLASS ENCAPSULATION - GENERAL APPLICATION CATEGORY Q |
BS CECC 90104:1981
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION: C - MOS DIGITAL INTEGRATED CIRCUITS, SERIES 4000B AND 4000UB |
BS EN 150012:1993
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - SINGLE GATE FIELD-EFFECT TRANSISTORS |
BS QC 750110:1990
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - REVERSE BLOCKING TRIODE THYRISTORS, AMBIENT AND CASE-RATED, UP TO 100 A |
BS EN 120002:1993
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: INFRARED EMITTING DIODES, INFRARED EMITTING DIODE ARRAYS |
BS 9364 N017:1979
|
DETAIL SPECIFICATION FOR LOW POWER SILICON N-P-N SWITCHING TRANSISTORS - 65 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION (LONG LEAD VERSION) - FULL PLUS ADDITIONAL ASSESSMENT LEVEL |
BS QC 750107:1991
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - CASE-RATED BIPOLAR TRANSISTORS FOR HIGH-FREQUENCY AMPLIFICATIONS |
BS EN 150010:1993
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: AMBIENT RATED THYRISTORS |
BS CECC 50008:1982
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: AMBIENT-RATED RECTIFIER DIODES |
BS EN 120003:1993
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - PHOTOTRANSISTORS, PHOTODARLINGTON TRANSISTORS, PHOTOTRANSISTOR ARRAYS |
BS 6493-1.1:1984
|
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - GENERAL |
BS CECC 63000:1990
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: FILM AND HYBRID INTEGRATED CIRCUITS |
BS CECC 90103:1983
|
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS |
BS CECC 50000:1987
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: DISCRETE SEMICONDUCTOR DEVICES |
BS 9450:1998
|
SPECIFICATION FOR INTEGRATED ELECTRONIC CIRCUITS AND MICRO-ASSEMBLIES OF ASSESSED QUALITY (CAPABILITY APPROVAL PROCEDURES) - GENERIC DATA AND METHODS OF TEST |
BS CECC 90104:1990
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION: C - MOS DIGITAL INTEGRATED CIRCUITS SERIES 4000 B AND 4000 UB |
BS 9364 N013:1979
|
DETAIL SPECIFICATION FOR LOW POWER SILICON P-N-P SWITCHING TRANSISTORS - 25 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION - FULL PLUS ADDITIONAL ASSESSMENT LEVEL |
BS EN 150004:1993
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: BIPOLAR TRANSISTORS FOR SWITCHING APPLICATIONS |
BS 6943:1988
|
CLASSIFICATION OF SHAPES OF ELECTRONIC COMPONENTS FOR PLACEMENT ON PRINTED WIRING BOARDS |
BS EN 150013:1993
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: CURRENT REGULATOR AND CURRENT REFERENCE DIODES |
BS QC 750108:1990
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - RECTIFIER DIODES (INCLUDING AVALANCHE RECTIFIER DIODES), AMBIENT AND CASE-RATED, UP TO 100 A |
BS 9364 N008 and N010:1978
|
DETAIL SPECIFICATION FOR LOW POWER SILICON N-P-N SWITCHING TRANSISTORS - 20 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION (LONG LEAD VERSION) - FULL PLUS ADDITIONAL ASSESSMENT LEVEL |
BS EN 120000:1996
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERAL SPECIFICATION: SEMICONDUCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES |
BS 9400(1970) : 1970 AMD 7224
|
SPECIFICATION FOR INTEGRATED ELECTRONIC CIRCUITS AND MICRO ASSEMBLIES OF ASSESSED QUALITY (QUALIFICATION APPROVAL PROCEDURES): GENERIC DATA AND METHODS OF TEST |
BS 9300:1969
|
SPECIFICATION FOR SEMICONDUCTOR DEVICES OF ASSESSED QUALITY: GENERIC DATA AND METHODS OF TEST |
BS CECC 90103:1980
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION - DIGITAL INTEGRATED TTL LOW POWER SCHOTTKY CIRCUITS SERIES 54LS, 64LS, 74LS, 84LS |
BS EN 150006:1993
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - VARIABLE CAPACITANCE DIODE(S) |
BS EN 120005:1993
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - PHOTODIODES, PHOTODIODE-ARRAYS (NOT INTENDED FOR FIBRE OPTIC APPLICATIONS) |
BS EN 150001:1993
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: GENERAL PURPOSE SEMICONDUCTOR DIODES |
BS QC 750112:1988
|
|
BS E9375:1975
|
SPECIFICATION - HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: VOLTAGE REGULATOR DIODES AND VOLTAGE REFERENCE DIODES EXCLUDING PRECISION-VOLTAGE TEMPERATURE-COMPENSATED REFERENCE DIODES |
BS 9305 N042:1972
|
DETAIL SPECIFICATION FOR SILICON VOLTAGE REGULATOR DIODES - 1.5 W, 6.8 TO 200 V (5%), HERMETICALLY SEALED - GENERAL APPLICATION CATEGORY C |
BS 9364 N007 and N009:1978
|
DETAIL SPECIFICATION FOR LOW POWER SILICON N-P-N SWITCHING TRANSISTORS - 20 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION - FULL PLUS ADDITIONAL ASSESSMENT LEVEL |
BS QC 760000:1990
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FILM AND HYBRID FILM INTEGRATED CIRCUITS - GENERIC SPECIFICATION |
BS EN 120004:1993
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - AMBIENT RATED PHOTOCOUPLERS WITH PHOTOTRANSISTOR OUTPUT |
BS 9450:1975
|
SPECIFICATION FOR INTEGRATED ELECTRONIC CIRCUITS AND MICRO-ASSEMBLIES OF ASSESSED QUALITY (CAPABILITY APPROVAL PROCEDURES): GENERIC DATA AND METHODS OF TEST |
BS CECC 90101:1980
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION: DIGITAL INTEGRATED TTL CIRCUITS, SERIES 54, 64, 74, 84 |
BS QC 750102:1990
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - AMBIENT-RATED BIPOLAR TRANSISTORS FOR LOW AND HIGH-FREQUENCY AMPLIFICATION |
BS CECC 50009:1982
|
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
BS 9305 N044:1974
|
DETAIL SPECIFICATION FOR SILICON VOLTAGE REGULATOR DIODES - 1.0 W, 3.3 TO 33 V (5%), HERMETICALLY SEALED - FULL ASSESSMENT LEVEL |
BS 9364 N012:1978
|
DETAIL SPECIFICATION FOR LOW POWER SILICON P-N-P SWITCHING TRANSISTORS - 65 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION (LONG LEAD VERSION) - FULL PLUS ADDITIONAL ASSESSMENT LEVEL |
BS 9364 N011:1978
|
DETAIL SPECIFICATION FOR LOW POWER SILICON P-N-P SWITCHING TRANSISTORS - 65 V, PLANAR EPITAXIAL, AMBIENT RATED, HERMETIC ENCAPSULATION - FULL PLUS ADDITIONAL ASSESSMENT LEVEL |
BS EN 190000:1996
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: MONOLITHIC INTEGRATED CIRCUITS |
BS E9372:1976
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: AMBIENT-RATED BIPOLAR TRANSISTORS FOR LOW AND HIGH FREQUENCY AMPLIFICATION |
EN 190000:1995
|
Generic Specification: Monolithic integrated circuits |
EN 150012 : 1991
|
Blank Detail Specification: Single gate field-effect transistors |