• BS 7681-3(1993) : 1993 AMD 9659

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    MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUES IN A x-NETWORK - BASIC METHOD FOR THE MEASUREMENT OF TWO-TERMINAL PARAMETERS UP TO 200 MHz BY PHASE TECHNIQUE IN A X-NETWORK WITH COMPENSATION OF THE PARALLEL CAPACITANCE C

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    Superseded date:  10-15-1997

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    Published date:  11-23-2012

    Publisher:  British Standards Institution

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