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BS 9940-03.0:1983

Current
Current

The latest, up-to-date edition.

Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Sectional specification: fixed precision resistors
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

10-31-1983

National foreword
Committees responsible
Section One - General
1. General
1.1 Scope
1.2 Object
1.3 Related documents
1.4 Information to be given in a detail specification
Section Two - Preferred ratings, characteristics and
test severities
2. Preferred ratings, characteristics and test
      severities
2.1 Preferred characteristics
2.2 Preferred values of ratings
2.3 Preferred test severities
Section Three - Quality assessment procedures
3. Quality assessment procedures
3.1 Structurally similar components
3.2 Qualification approval
3.3 Quality conformance inspection

Prescribes preferred ratings and characteristics and selects methods of test and inspection requirements for detail specifications for this type of resistor.

This standard applies to fixed precision resistors for use in electronic equipment.

Committee
W/-
DevelopmentNote
Also numbered as IEC 60115-5 and QC 400300 Supersedes 79/21297 DC (10/2005)
DocumentType
Standard
Pages
18
PublisherName
British Standards Institution
Status
Current

BS 9940-03.01:1984 Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Blank detail specification: fixed precision resistors. Assessment level E
BS QC 400302:1992 Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed precision resistors. Assessment level F

BS 2488:1966 Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment
BS 9940-0:1983 Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Generic specification
BS 6001(1972) : AMD 5054 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION

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