Harmonized system of quality assessment for electronic components. Sectional specification: electromechanical all-or-nothing relays

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

08-29-1980

Publisher

British Standards Institution

Foreword
Preface
Section 1 - Scope
Section 2 - General
2.1 Related documents
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar relays
3.3 Qualification approval tests
3.4 Formation of inspection lots
3.5 Test schedules
3.6 Order of tests
Section 4 - Writing of blank detail and detail
specifications
4. Table I, Test schedules, with explanations
Section 5 - Marking
5.1 Relay
5.2 Package
Appendix A - Explanations and examples regarding IL-
and AQL-values

Selects from the generic specification BS CECC 16000 the appropriate methods of test to be used in detail specifications for the above. Presents 3 basic test schedules and gives rules for writing blank detail specifications which contain the detailed test schedules.

Committee	W/-
DevelopmentNote	Supersedes 77/29527 DC. Inactive for the new design. (01/2006)
DocumentType	Standard
Pages	22
PublisherName	British Standards Institution
Status	Current

Standards	Relationship
CECC 16100 : 1979	Identical

CECC 16101 : 1980	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - TEST SCHEDULE 3
BS CECC 16101:1980	Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing relays. Test schedule 3

BS 9000(1967) : LATEST
BS 9151:1972	Rules for the preparation of detail specifications for all-or-nothing electromechanical relays of assessed quality. Full and basic assessment levels
CECC 00100 : 1988	BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V
IEC 60410:1973	Sampling plans and procedures for inspection by attributes
BS E9000-1(1977) : LATEST
IEC 60225:1966	Octave, half-octave and third-octave band filters intended for the analysis of sounds and vibrations
BS 6001(1972) : AMD 5054	SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION
BS E9000-2(1978) : LATEST

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BS CECC 16100:1980

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Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referenced By This Book

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