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BS CECC 63000:1990

BS CECC 63000:1990

Current

Current

The latest, up-to-date edition.

Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

12-31-1990

Publisher

British Standards Institution

Foreword
Preface
Section 1 - Scope
Section 2 - General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Standard and preferred values
2.5 Marking
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Manufacturing stages and sub-contracting
3.3 Manufacturer's approval
3.4 Approval of Film and Hybrid Integrated Circuits
       (F&HICs)
3.5 Qualification approval
3.6 Capability approval
3.7 Certified test records
3.8 Delayed deliveries
3.9 Delivery of F&HICs subjected to destructive or
       non destructive tests
3.10 Supplementary procedure for deliveries
3.11 Supplementary information
Section 4 - Test and measurement procedures
4.1 General
4.2 Standard conditions for testing
4.3 Visual examination
4.4 Electrical measurement procedures
4.5 Environmental testing procedures
4.6 Screening
Annex A - Internal visual examination

Defines procedures and methods for testing and states requirements for the release of products using either qualification approval or capability approval procedures.

Committee
EPL/47
DevelopmentNote
Inactive for the new design. Supersedes BS CECC63000(1985), 85/30968 DC, 85/30991 DC and 87/23094 DC (01/2006)
DocumentType
Standard
Pages
60
PublisherName
British Standards Institution
Status
Current

Standards Relationship
CECC 63000 : 84 AMD 5 Identical

CECC 64000 : 1988 GENERIC SPECIFICATION: FILM RESISTOR NETWORKS
BS 5555:1993 Specification for SI units and recommendations for the use of their multiples and of certain other units
IEC 60147-1:1972 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics
CECC 00109 : 1974 CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS
CECC 00107(PT3) : 80 AMD 1 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR CAPABILITY APPROVAL
IEC 60191-1:2007 Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
BS 2011-2.1B:1977 Environmental testing. Tests Tests B. Dry Heat
BS 9000-2(1996) : 1996 GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM
BS E9007:1975 Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes
CECC 00100 : 1988 BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V
BS 2011-2.1XA(1981) : 1981 AMD 7553 ENVIRONMENTAL TESTING - TESTS - TEST XA AND GUIDANCE - IMMERSION IN CLEANING SOLVENTS
IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
BS 2011-2.1N:1985 Environmental testing. Tests Test N. Change of temperature
BS 2011-2.1Ca:1977 Environmental testing. Tests Test Ca. Damp heat, steady state
CECC 00110 : 1994 RULE OF PROCEDURE 10 - NATIONAL IMPLEMENTATION OF CECC PRODUCED EUROPEAN STANDARDS AND SPECIFICATIONS
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
BS 4727(1971) : LATEST
CECC 00107(PT2) : 79 AMD 1 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR ENHANCED ASSESSMENT OF QUALITY
IEC 60147-0B:1969 Supplement B - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods - Part 0: General and terminology
CECC 00107(PT1) : 1982 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - QUALITY ASSESSMENT PROCEDURE FOR GENERAL USAGE
IEC TR 60440:1973 Method of measurement of non-linearity in resistors
CECC 00111 : 80 AMD 3 CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY
BS 2011-2.1Ka:1982 Environmental testing. Tests Test Ka.Salt mist
IEC 60147-0:1966 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology
IEC 60148A:1974 First supplement - Letter symbols for semiconductor devices and integrated microcircuits
BS 3934:1965 Specification for dimensions of semiconductor devices and integrated electronic circuits
IEC 60148:1969 Letter symbols for semiconductor devices and integrated microcircuits
IEC 60147-0D:1974 Supplement D - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods -Part 0: General and terminology
CECC 00108 : 94 AC 98 RULE OF PROCEDURE 8 (ATTESTATION OF CONFORMITY) - PART 1: THE CECC MARK AND CONDITIONS OF USE - PART 2: CERTIFICATES OF APPROVAL - PART 3: PROCEDURES FOR THE ATTESTATION OF CONFORMITY
BS 2011-3A & B:1977 Environmental testing. Background information Tests A (cold) and tests B (dry heat)
IEC 60191-3:1999 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
BS 2011-2.1T:1981 Environmental testing. Tests Test T. Soldering

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