BS CECC 90200:1988
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits
Hardcopy , PDF
English
02-29-1988
Foreword
Preface
1 Scope
2 General
2.1 Related documents
2.2 Preferred voltages for analogue monolithic
integrated circuits
2.3 Symbols and terminology
3 Quality assessment procedures
3.1 Structurally similar circuits
3.2 Certified test records
4 Test and measurement procedures
4.1 Electrical measurement procedures
4.1.1 Measuring methods for linear amplifiers
(including operational amplifiers)
4.1.2 Measuring methods for voltage regulators
4.1.3 Measuring methods for analogue switches
4.2 Endurance tests
4.2.1 General
4.2.2 Test conditions
5 Common blank detail specification for analogue
monolithic integrated circuits
5.1 Introduction
5.2 Front page
5.3 Identification of the component and supplementary
information
5.4 Ratings (limiting values) (not for inspection
purposes)
5.5 Recommended conditions for use and associated
characteristics (not for inspection purposes)
5.6 Supplementary information
5.7 Inspection requirements
5.7.1 Explanation of assessment quality levels P, Y and
L
5.7.2 Key of abbreviations
Group A inspection
Group B inspection
Group C inspection
Group D inspection
Annex
A Non IEC measuring methods
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