Harmonized system of quality assessment for electronic components. Basic specification: CECC assessed process average procedure (60% confidence limit)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

10-01-1992

Publisher

British Standards Institution

Foreword
Preface
1. General
2. Procedure

Gives a procedure applicable to large-scale production for obtaining information on the \'assessed process average\' of production.

Committee	W/-
DevelopmentNote	Renumbers and supersedes BS CECC00014(1988). 1992 version incorporates amendment 7195 to BS CECC00014(1988). (01/2006)
DocumentType	Standard
Pages	16
PublisherName	British Standards Institution
Status	Current
Supersedes	BS CECC00014(1988) : 1988 AMD 7195

BS EN 132100:1997	Harmonized system of quality assessment for electronic components. Sectional specification: fixed mulitlayer ceramic surface mounting capacitors. Assessment levels EZ and DZ
BS EN 140103:1996	Harmonized system of quality assessment for electronic components. Blank detail specification. Fixed low power non-wirewound resistors (Assessment level P)
BS EN 132101:1997	Blank detail specification. Fixed multilayer ceramic surface mounting capacitors. Assessment level EZ
BS EN 140104:1996	Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (Assessment levels SB and SC)
BS EN 134000:1995	Harmonized system of quality assessment for electronic components. Generic specification: variable capacitors. (Qualification approval and capability approval)
BS EN 140102:1996	Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (assessment level M)
BS EN 132102:1997	Blank detail specification. Fixed multilayer ceramic surface mounting capacitors. Assessment level DZ

BS 9000-1(1971) : LATEST
MIL-STD-690 Revision D:2005	Failure Rate (FR) Sampling Plans and Procedures

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BS EN 100014:1992