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BS EN 136000:1993

BS EN 136000:1993

Current

Current

The latest, up-to-date edition.

Harmonized system of quality assessment for electronic components: generic specification: magnetrons

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

08-31-1978

Publisher

British Standards Institution

Foreword
Preface
Section 1 - Scope
Section 2 - General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Standard and preferred values
2.5 Marking
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structural similarity
3.3 Qualification approval procedure
3.4 Quality conformance inspection
3.5 Resubmission of rejected lots
3.6 Certified test records
3.7 Delayed delivery
Section 4 - Test and measurement procedures
4.1 General
4.2 Alternative methods
4.3 Standard conditions for testing
4.4 Visual inspection and check of dimensions
4.5 Electrical measurement procedures
4.6 Mechanical measurement procedures
4.7 Environmental tests
4.8 Endurance tests
4.9 Additional test and measurement procedures

General details, related documentation, quality assessment and test and measurement procedures for a range of both pulsed and CW magnetrons.

Committee
PEL/13
DevelopmentNote
Renumbers and supersedes BS CECC36000(1978). 1993 Version incorporates amendment 7581 to BS CECC36000(1978). Also numbered as CECC 36000. Supersedes BS 9030(1971) and 74/28990 DC. (09/2005)
DocumentType
Standard
Pages
18
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
NEN EN 136000 : 2004 Identical
EN 136000:1992 Identical
I.S. EN 136000:1994 Identical
DIN EN 136000:1993-06 Identical

BS EN 136001:1996 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pulsed magnetrons (excluding frequency agile magnetrons)
BS EN 136002:1996 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications

BS 5555:1993 Specification for SI units and recommendations for the use of their multiples and of certain other units
BS 9000(1967) : LATEST
CECC 00107(PT3) : 80 AMD 1 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR CAPABILITY APPROVAL
BS E9006(1976) : LATEST HARMONISED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BASIC SPECIFICATION. ENVIRONMENTAL PROCEDURES
BS E9007:1975 Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes
BS 4727-1:GRP06(1973) : 1973 GLOSSARY OF ELECTROTECHNICAL POWER TELECOMMUNICATION ELECTRONICS LIGHTING AND COLOUR TERMS - TERMS COMMON TO POWER TELECOMMUNICATIONS & ELECTRONICS - ELECTRONIC TUBE TERMINOLOGY
BS E9000-1(1977) : LATEST
CECC 00107(PT2) : 79 AMD 1 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR ENHANCED ASSESSMENT OF QUALITY
CECC 00107(PT1) : 1982 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - QUALITY ASSESSMENT PROCEDURE FOR GENERAL USAGE
BS 2011(1967) : LATEST
BS 6001(1972) : AMD 5054 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION
BS E9000-2(1978) : LATEST

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PDF - English
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