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BS EN 13925-2:2003

BS EN 13925-2:2003

Current

Current

The latest, up-to-date edition.

Non-destructive testing. X-ray diffraction from polycrystalline and amorphous materials Procedures

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

03-20-2003

Publisher

British Standards Institution

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Specimen preparation
  4.1 General preparation
  4.2 Block specimens
  4.3 Powder specimens
  4.4 Analysis of small quantities of sample
  4.5 Reactive samples and non-ambient conditions
5 Data collection
  5.1 General considerations
  5.2 Angular range and mode of data collection
  5.3 Parameters relevant to the quality of collected data
6 Data processing and analysis
  6.1 Background
  6.2 Peal searching
  6.3 Pattern decomposition into individual line profiles
      including background subtraction
  6.4 Phase identification
  6.5 Indexing
  6.6 Lattice parameter refinement
  6.7 Other types of analysis
Annex A (informative) Relationship between the XRPD standards
Annex B (informative) Example of Report Form
Annex C (informative) Scheme of a typical procedure for
        XRPD measurements
Annex D (informative) Some analytical functions used for
        profile fitting
Annex E (informative) Some methods for testing the internal
        consistency of XRPD data
        E.1 General
        E.2 Figures of Merit for FWHMs and intensities
        E.3 Figures of Merit for line positions and lattice
            parameters
Bibliography

Describes the basic procedures applied in the X-ray Powder Diffraction (XRPD) method.

This European Standard specifies the basic procedures applied in the X-ray Powder Diffraction (XRPD) method. Many of these procedures are common to most types of diffractometer used and types of analysis mentioned in EN 13925-1. In the interests of clarity and immediate usability more details are given for procedures using instruments with Bragg-Brentano geometry and application to phase identification. Aspects of specimen preparation and data quality assessment are included, but the standard remains non-exhaustive. It is anticipated that particular standards will address specific fields of application in more details.

Committee
WEE/46
DevelopmentNote
Supersedes 00/710452 DC (04/2003) Reviewed and confirmed by BSI, December 2008. (11/2008)
DocumentType
Standard
Pages
26
PublisherName
British Standards Institution
Status
Current
Supersedes

PD 6699-1:2007 Nanotechnologies Good practice guide for specifying manufactured nanomaterials

ISO 5725-1:1994 Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions
EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles

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Hardcopy - English
PDF - English
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