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BS EN 16602-60-13:2015

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Space product assurance. Requirements for the use of COTS components
Available format(s)

Hardcopy , PDF

Superseded date

07-13-2023

Language(s)

English

Published date

08-31-2015

European foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Requirements for class 1 components
5 Requirements for class 2 components
6 Requirements for class 3 components
7 Quality levels
8 Evaluation and lot acceptance for retinned parts
9 Pure tin lead finish - risk analysis
Annex A (normative) - Component control plan (CCP) - DRD
Annex B (normative) - Declared components list (DCL) - DRD
Annex C (normative) - Internal Supplier's specification - DRD
Annex D (normative) - Parts approval document - DRD
Annex E (informative) - EEE documents delivery per review
Annex F (normative) - Justification document - DRD
Annex G (informative) - Difference between the three classes
Annex H (informative) - Flow chart for construction analysis
        and destructive physical analysis
Bibliography

Explains the requirements for selection, control, procurement and usage of EEE commercial components for space projects.

This standard defines the requirements for selection, control, procurement and usage of EEE commercial components for space projects. This standard is applicable to commercial encapsulated active monolithic parts (integrated circuits and discrete): diodes microwave diodes integrated circuits microwave integrated circuits (MMIC) transistors microwave transistors This standard is not applicable to the commercial parts from the following families: capacitors connectors crystals filters fuses heaters inductors microwave passive parts oscillators relays resistors switches thermistors transformers cables & wires hybrids surface acoustic waves (SAW) charge coupled devices (CCD) active pixel sensors (APS) In addition, the following families of EEE components are not addressed by the present ECSS standard but it can be used as guideline and revisited on case/case basis: photodiodes light emitting diodes (LED) phototransistors opto-couplers laser diodes In line with ECSS-Q-ST-60, this standard differentiates between three classes of components through three different sets of standardization requirements (clauses) to be met. The three classes provide for three levels of trade-off between assurance and risk. The highest assurance and lowest risk is provided by class 1 and the lowest assurance and highest risk by class 3. Procurement costs are typically highest for class 1 and lowest for class 3. Mitigation and other engineering measures can decrease the total cost of ownership differences between the three classes. The project objectives, definition and constraints determine which class or classes of components are appropriate to be utilised within the system and subsystems. Class 1 components are described in Clause 4 Class 2 components are described in Clause 5 Class 3 components are described in Clause 6 Annex G includes a diagram that summarizes the difference between these three classes for evaluation, screening and lot acceptance. The requirements of this document are applicable to all parties involved at all levels in the integration of EEE commercial components into space segment hardware and launchers. For easy tailoring and implementation of the requirements into a Requirement Management Tool, and for direct traceability to ECSS-Q-ST-60, requirements in this standards have been written in the way of a ECSS Applicability Requirement Matrix (EARM), as defined in Annex A of ECSS-S-ST-00 “ECSS system – Description, implementation and general requirements??. This standard may be tailored for the specific characteristics and constrains of a space project in conformance with ECSS-S-ST-00.

Committee
ACE/68
DocumentType
Standard
Pages
102
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Standards Relationship
EN 16602-60-13:2015 Identical

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
IPC J STD 033C-1:2014 HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES
EN 16601-00-01:2015 Space systems - Glossary of terms
EN 16602-70-08:2015 Space product assurance - Manual soldering of high-reliability electrical connections
EN 16602-60-15:2014 Space product assurance - Radiation hardness assurance - EEE components
EN 16602-60-14:2014 Space product assurance - Relifing procedure - EEE components
EN 16602-60:2015 Space product assurance - Electrical, electronic and electromechanical (EEE) components

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