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BS EN 168000:1996

BS EN 168000:1996

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units

Available format(s)

Hardcopy , PDF

Superseded date

02-05-2003

Language(s)

English

Published date

12-31-1990

Publisher

British Standards Institution

FOREWORD
Section 1 - Scope
Section 2 - General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Preferred ratings and characteristics
2.5 Marking
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Subcontracting
3.4 Manufacturer's approval
3.5 Approval procedures
3.6 Procedures for capability approval
3.7 Procedures for qualification approval
3.8 Test procedures
3.9 Screening requirements
3.10 Rework and repair work
3.11 Certified test records
3.12 Delayed delivery
3.13 Release for delivery
3.14 Unchecked parameters
Section 4 - Test and measurement procedures
4.1 General
4.2 Alternative methods
4.3 Precision of measurement
4.4 Standard conditions for testing
4.5 Visual inspection
4.6 Dimensioning and gauging procedures
4.7 Electrical test procedures
4.7.1 Frequency and resonance resistance
4.7.2 Drive level dependency
4.7.3 Frequency and resonance resistance as a function
       of temperature
4.7.4 Unwanted responses
4.7.5 Shunt capacitance
4.7.6 Load resonance frequency and resistance
4.7.7 Frequency pulling range
4.7.8 Motional parameters
4.7.9 Insulation resistance
4.8 Mechanical and environmental test procedures
4.8.1 Robustness of terminations
4.8.2 Sealing tests
4.8.3 Soldering (Solderability and resistance to solder
       heat)
4.8.4 Rapid change of temperature, two-fluid-bath method
4.8.5 Rapid change of temperature with prescribed time
       of transition
4.8.6 Bump
4.8.7 Vibration
4.8.8 Shock
4.8.9 Free fall
4.8.10 Acceleration, steady state
4.8.11 Dry heat
4.8.12 Damp heat, cyclic
4.8.13 Cold
4.8.14 Climatic sequence
4.8.15 Damp heat steady state
4.8.16 Immersion in cleaning solvents
4.9 Endurance test procedure
4.9.1 Ageing
4.9.2 Extended ageing
4.9.3 Shelf life
Annex A. Drive level dependency

Methods of test and general requirements for units of assessed quality, using either capability approval or qualification approval procedures.

Committee
W/-
DevelopmentNote
Supersedes and renumbers BS CECC68000(1990) (07/2004)
DocumentType
Standard
Pages
36
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

BS EN 168200:1996 Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
BS EN 168201:1996 Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval)

CECC 00114-3 : 94 AMD 2 CAPABILITY APPROVAL OF AN ELECTRONIC COMPONENT MANUFACTURING ACTIVITY
CECC 00109 : 1974 CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
CECC 00802 : 1994 GUIDANCE DOCUMENT: CECC STANDARD METHOD FOR THE SPECIFICATION OF SURFACE MOUNTING (SMDs) OF ASSESSED QUALITY
IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
IEC 60068-2-11:1981 Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist
IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
CECC 00114-2 : 1994 RULE OF PROCEDURE 14 - QUALITY ASSESSMENT PROCEDURES - PART 2: QUALIFICATION APPROVAL OF ELECTRONIC COMPONENTS
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
CECC 00111 : 80 AMD 3 CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY
IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 60027-2:2005 Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics
IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
IEC 60302:1969 Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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