BS EN 50513:2009
Current
The latest, up-to-date edition.
Hardcopy , PDF
English
10-31-2009
1 Scope
2 Normative references
3 Terms, definitions and acronyms
4 Crystallisation process
5 Product characteristics
6 Packaging, marking and storage
7 Major changes of product and processes
8 Wafer thickness
9 Variations in thickness
10 Waviness and warping
11 Grooves and step type saw mark
12 Corrosion rate
13 Determining carrier lifetime measured on as cut wafer
14 Determining minority carrier bulk lifetime measured on
passivated wafers (laboratory measurement)
15 Electrical resistivity of multi and mono crystalline
semiconductor wafers
16 Method for the measurement of substitutional atomic
carbon and interstitial oxygen content in silicon used
as solar material
Annex A (informative) - Geometric dimensions, surfaces and
edge characteristics
Annex B (informative) - Optional requirements
Bibliography
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