Measurement of quartz crystal unit parameters Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance C0

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

09-15-1993

Publisher

British Standards Institution

Committees responsible
National foreword
Method
1 Scope
2 Co compensation circuit
    2.1 Electrical specifications
    2.2 Mechanical specification
3 Crystal unit parameters with and without Co
    compensation
    3.1 Series resonance frequency fs and resonance
          frequency fr
    3.2 Motional resistance Rl and resonance resistance
          Rr
    3.3 Motional capacitance Cl and motional inductance
          Ll
4 Test circuit
    4.1 The pi-network
    4.2 Accessories of the pi-network
    4.3 Associated equipment
    4.4 Compensation circuit
5 Method of measurement
    5.1 Initial calibration of the pi-network
    5.2 Tuning of the compensation circuit
    5.3 Frequency and resistance measurement
    5.4 Evaluation of the motional capitance Cl and
          motional inductance Ll
Appendices
A Analysis of the difference of f, R, Cl and Ll as result
    of measurement methods with and without compensation of Co
B Additional information on accuracy
C Additional information on circuit components given in
    Figures 4a) and 4b)
Table
A1 Typical values for parameters of oscillator crystal units
    and the calculated theoretical differences between
    parameters increased with and without compensation
Figures
1 Equivalent circuit of a crystal unit with compensation
    of Co
2 Impedance diagram of a crystal unit without compensation
    of parallel capacitance Co
3 Impedance diagram of a crystal unit when Co is
    compensated with a properly tuned compensation network
    according to Figure 1
4a Simplified diagram of the pi-network with electrical
    adjustment of Co compensation
4b Simplified diagram of the pi-network with mechanical
    adjustment of Co compensation
5 Test circuit

Defines a method for measuring the parameters of quartz crystal units by means of an inductance for compensation for the effects of Co at the frequency of the crystal unit, with accuracy dependent on the type of crystals for frequency with a fractional accuracy ranging between 10-6 and 10-8, 2% and 5% and motional capacitance and inductance with a fractional accuracy between 3% and 7%.

Committee	W/-
DevelopmentNote	Renumbers and supersedes BS 7681-3(1993) 1997 version incorporates amendment 9659 to BS 7681-3(1993) Also numbered as IEC 60444-3 (11/2005)
DocumentType	Standard
Pages	20
PublisherName	British Standards Institution
Status	Current
Supersedes	BS 7681-3(1993) : 1993 AMD 9659

Standards	Relationship
I.S. EN 60444-3:1999	Identical
NF EN 60444-3 : 2001	Identical
EN 60444-3:1997	Identical
DIN EN 60444-3:1997-10	Identical
NBN EN 60444-3 : 1997	Identical
SN EN 60444-3 : 1997	Identical