BS EN 60749-29:2003
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Hardcopy , PDF
01-01-2011
English
06-29-2004
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing \'No Trouble Found\' and \'Electrical Overstress\' failures due to latch-up.
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