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BS EN 60749-44:2016

BS EN 60749-44:2016

Current

Current

The latest, up-to-date edition.

Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

11-30-2016

Publisher

British Standards Institution

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure neutron irradiated soft error test
6 Evaluation
7 Summary
Annex A (informative) - Additional information
        for the applicable procurement specification
Annex B (informative) - White neutron test apparatus
Annex C (informative) - Failure rate calculation
Bibliography

Defines a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.

IEC 60749-44:2016 establishes a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays. The single event effects sensitivity is measured while the device is irradiated in a neutron beam of known flux. This test method can be applied to any type of integrated circuit.
NOTE 1 - Semiconductor devices under high voltage stress can be subject to single event effects including SEB, single event burnout and SEGR single event gate rupture, for this subject which is not covered in this document, please refer to IEC 62396-4.
NOTE 2 - In addition to the high energy neutrons some devices can have a soft error rate due to low energy (

Committee
EPL/47
DevelopmentNote
Supersedes 14/30299002 DC. (11/2016)
DocumentType
Standard
Pages
26
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
EN 60749-44:2016 Identical
BIS IS/IEC 61558-2-6 : 1ED 2016 Identical
IEC 60749-44:2016 Identical
BIS IS/IEC 61558-2-6 : 1ED 2016 Identical

IEC 60749-38:2008 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
IEC 62396-4:2013 Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects
IEC 62396-5:2014 Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems

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Hardcopy - English
PDF - English
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