Electromagnetic compatibility (EMC). Testing and measurement techniques Testing and measurement techniques. Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests - Voltage dips, short interruptions and voltage variations on d.c.input power ports. Immunity tests. Basic EMC Publication.

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

07-15-2001

Publisher

British Standards Institution

Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.

Committee	GEL/210
DevelopmentNote	Also numbered as IEC 61000-4-29 (06/2001) Supersedes 97/260874 DC (05/2005)
DocumentType	Standard
Pages	22
PublisherName	British Standards Institution
Status	Current
Supersedes	97/260874 DC : SEP 97

Standards	Relationship
IEC 60738-1:2006	Identical
UNE-EN 61000-4-29:2002	Identical
SN EN 61000-4-29 : 2000	Identical
NF EN 61000-4-29 : 2001	Identical
DIN EN 61000-4-29 : 2001-10	Identical
EN 61000-4-29:2000	Identical
I.S. EN 61000-4-29:2000	Identical

EN 61000-4-11:2004/A1:2017	ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-11: TESTING AND MEASUREMENT TECHNIQUES - VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS IMMUNITY TESTS (IEC 61000-4-11:2004/A1:2017)
IEC 61000-4-11:2004+AMD1:2017 CSV	Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests