HD 323.2.20 : 200S3
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BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
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IEC 60068-1:2013
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Environmental testing - Part 1: General and guidance
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IEC 60068-2-58:2015+AMD1:2017 CSV
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Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
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IEC 60068-2-27:2008
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Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
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IEC 60068-2-20:2008
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Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
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EN 60068-2-1:2007
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Environmental testing - Part 2-1: Tests - Test A: Cold
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EN 61338-1-3:2000
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Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
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IECQ 001002-3:2005
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IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES
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EN 60068-2-2:2007
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Environmental testing - Part 2-2: Tests - Test B: Dry heat
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IEC 60068-2-21:2006
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Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
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IEC 60068-2-13:1983
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Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
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EN 60068-1:2014
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Environmental testing - Part 1: General and guidance
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IEC 61338-4:2005
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Waveguide type dielectric resonators - Part 4: Sectional specification
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IECQ 001002-2:1998
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IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION
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EN 60068-2-7:1993
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Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state
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EN 60068-2-27:2009
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Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
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EN 60068-2-21:2006
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Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
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IEC 60068-2-2:2007
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Environmental testing - Part 2-2: Tests - Test B: Dry heat
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IECQ 001002-1:1998
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IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 1: ADMINISTRATION
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EN 60068-2-29:1993
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Environmental testing - Part 2: Tests - Test Eb and guidance: Bump
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EN 60068-2-78:2013
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Environmental testing - Part 2-78: Tests - Test Cab: Damp heat, steady state
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EN 60068-2-13:1999
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Environmental testing - Part 2: Tests - Test M: Low air pressure
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EN 60068-2-6:2008
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Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
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IEC 60050-561:2014
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International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
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IEC 60068-2-29:1987
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Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
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IEC 60068-2-1:2007
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Environmental testing - Part 2-1: Tests - Test A: Cold
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EN 60068-2-30:2005
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Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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IEC 60068-2-14:2009
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Environmental testing - Part 2-14: Tests - Test N: Change of temperature
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EN 60068-2-14:2009
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Environmental testing - Part 2-14: Tests - Test N: Change of temperature
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IEC 61338-1-3:1999
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Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
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IEC 60068-2-30:2005
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Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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