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BS EN 62132-8:2012

Current

Current

The latest, up-to-date edition.

Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

10-31-2012

1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test setup
8 Test procedure
9 Test report
10 RF immunity acceptance level
Annex A (normative) - Field strength determination
Annex B (normative) - IC stripline descriptions
Annex C (informative) - Closed stripline
        geometrical limitations
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.

IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.

This publication is to be read in conjunction with IEC 62132-1:2006.

Committee
EPL/47
DevelopmentNote
Supersedes 09/30191126 DC. (10/2012)
DocumentType
Standard
Pages
26
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
EN 61804-2:2007 Identical
EN 62132-8 : 2012 Identical
IEC 62132-8:2012 Identical

EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 61000-4-20:2010 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
EN 61000-4-20:2010 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES

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