BS EN IEC 60749-12:2018
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Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
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04-18-2018
This part of IEC60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.
NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.
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