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BS IEC 61445:2012

Current
Current

The latest, up-to-date edition.

Digital Test Interchange Format (DTIF)
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

05-31-2013

1 Overview
2 References
3 Definitions and acronyms
4 Data organization overview of the DTIF standard
  environment
5 File specifications
6 Conformance
Annex A (informative) - Implementation overview
Annex B (informative) - DTIF dependency diagrams
Annex C (informative) - Example circuit
Annex D (informative) - IEEE List of Participants

Specifies the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies.

This standard defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following: UUT Model; Stimulus and Response; Fault Dictionary; Probe.

Committee
EPL/501
DocumentType
Standard
Pages
112
PublisherName
British Standards Institution
Status
Current

Standards Relationship
IEC 61445:2012 Identical

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