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BS IEC 61671:2012

Current
Current

The latest, up-to-date edition.

IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

08-31-2012

Publisher

British Standards Institution

1. Overview
2. Normative references
3. Definitions, acronyms, and abbreviations
4. Automatic test system (ATS) architecture
5. Automatic test markup language (ATML)
6. The ATML framework
7. ATML specification techniques
8. The ATML framework subdomains
9. ATML XML schema names and locations
10. ATML XML schema extensibility
11. Conformance
Annex A (normative) - XML schema style guidelines
Annex B (normative) - ATML common element schemas
Annex C (normative) - ATML internal model schemas
Annex D (normative) - ATML runtime services
Annex E (informative) - Pins, ports, connectors, and wire
        lists in ATML
Annex F (informative) - ATML capabilities
Annex G (informative) - IEEE download Web site material
        associated with this document
Annex H (informative) - ATS architectures
Annex I (informative) - Architecture examples
Annex J (informative) - UML models
Annex K (informative) - Glossary
Annex L (informative) - Bibliography
Annex M (informative) - IEEE List of Participants

Describes a standard exchange medium for sharing information between components of ATSs.

ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.

Committee
EPL/501
DocumentType
Standard
Pages
394
PublisherName
British Standards Institution
Status
Current

Standards Relationship
IEC 61671:2012 Identical

IEEE 1641.1-2013 IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
IEEE 1671.4-2014 IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration
IEEE 1671.3-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
IEEE 1057-2007 REDLINE IEEE Standard for Digitizing Waveform Recorders
IEEE 1155 : 1992 VMEBUS EXTENSIONS FOR INSTRUMENTATION: VXIBUS
TIA 232 : F1997(R2012) INTERFACE BETWEEN DATA TERMINAL EQUIPMENT AND DATA CIRCUIT-TERMINATING EQUIPMENT EMPLOYING SERIAL BINARY DATA INTERCHANGE
IEEE 1671.5-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description
IEC 60488-2:2004 Standard digital interface for programmable instrumentation - Part 2: Codes, formats, protocols and common commands
IEEE 802.3-2012 IEEE Standard for Ethernet
IEEE 1671.6-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
IEEE 260.1 : 2004 LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
IEEE 1445-1998 IEEE Standard for Digital Test Interchange Format (DTIF)
EIA 682 : 1996 EDIF VERSION 400 ELECTRONIC DESIGN INTERCHANGE FORMAT
IEEE 488.2 : 1992 STANDARD CODES, FORMATS, PROTOCOLS, AND COMMON COMMANDS FOR USE WITH IEEE 488.1-1987, IEEE STANDARD DIGITAL INTERFACE FOR PROGRAMMABLE INSTRUMENTATION
IEEE 1505.1-2008 IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
IEEE 1671.2-2012 IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
ISO 8601:2004 Data elements and interchange formats Information interchange Representation of dates and times
ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
IEEE 1636-2009 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)
ISO/IEC 9899:2011 Information technology Programming languages C
IEEE 1636.1-2013 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
IEEE 754-2008 REDLINE IEEE Standard for Floating-Point Arithmetic
IEEE 1671.1-2009 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture
IEEE/Open Group 1003.1, 2013 Edition IEEE Standard for Information Technology—Portable Operating System Interface (POSIX(TM)) Base Specifications, Issue 7
MIL-STD-1309 Revision D:1992 DEFINITIONS OF TERMS FOR TEST, MEASUREMENT AND DIAGNOSTIC EQUIPMENT

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