BS IEC 62047-30:2017
Current
Current
The latest, up-to-date edition.
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
10-09-2017
Publisher
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test bed of MEMS piezoelectric thin film
5 Thin film under testing
6 Test report
Annex A (informative) - Example of measuring method
of MEMS piezoelectric thin film
Bibliography
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