Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-31-2016

Publisher

British Standards Institution

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Common test interface requirements
Annex A (normative) - Common test interface signal
definitions for pin map
Annex B (informative) - Bibliography
Annex C (informative) - IEEE List of Participants

Pertains to military and aerospace automatic test equipment (ATE) testing applications.

The scope of this standard is the definition of a pin map utilizing the IEEE 1505^{™ 1} receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

Committee	EPL/501
DocumentType	Standard
Pages	174
PublisherName	British Standards Institution
Status	Current

Standards	Relationship
IEC 63003:2015	Identical

MIL-DTL-55302 Revision G:2009	CONNECTORS, PRINTED CIRCUIT SUBASSEMBLY AND ACCESSORIES
IEEE 260.3-1993	American National Standard Mathematical Signs and Symbols for Use in Physical Sciences and Technology
IEEE 260.1 : 2004	LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
IEEE 945-1984	IEEE Recommended Practice for Preferred Metric Units for Use in Electrical and Electronics Science and Technology
IEEE/ASTM SI_10-2010	American National Standard for Metric Practice
MIL C 83733 : C	CONNECTOR, ELECTRICAL, MINIATURE, RECTANGULAR TYPE, RACK TO PANEL, ENVIRONMENT RESISTING, 200 DEGREES C TOTAL CONTINUOUS OPERATING TEMPERATURE, GENERAL SPECIFICATION FOR
IEEE 315 : 1975	GRAPHIC SYMBOLS FOR ELECTRICAL AND ELECTRONICS DIAGRAMS (INCLUDING REFERENCE DESIGNATION LETTERS)
MIL-PRF-28800 Revision F:1996	TEST EQUIPMENT FOR USE WITH ELECTRICAL AND ELECTRONIC EQUIPMENT, GENERAL SPECIFICATION FOR
MIL-HDBK-217 Revision F:1991	RELIABILITY PREDICTION OF ELECTRONIC EQUIPMENT
IEEE 1149.1-2013 REDLINE	IEEE Standard for Test Access Port and Boundary-Scan Architecture

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BS IEC 63003:2015

Current

Table of Contents

Abstract

Scope

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory

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