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BS ISO 16531:2013

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

Available format(s)

Hardcopy , PDF

Superseded date

10-06-2020

Language(s)

English

Published date

05-31-2013

Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions, symbols and abbreviated terms
4 System requirements
5 Ion beam alignment methods
6 When to align and check ion beam alignment
Annex A (informative) - Comparison of AES depth
        profiles with good/poor ion beam alignment
Annex B (informative) - Alignment using cup with
        co-axial electrodes
Bibliography

Describes methods for the alignment of the ion beam to ensure good depth resolution in sputter depth profiling and optimal cleaning of surfaces when using inert gas ions in Auger electron spectroscopy and X-ray photoelectron spectroscopy.

Committee
CII/60
DevelopmentNote
Supersedes 12/30241146 DC. (05/2013)
DocumentType
Standard
Pages
30
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
ISO 16531:2013 Identical

ISO 18115-1:2013 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
ISO 14606:2015 Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials

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US$237.18
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