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BS ISO 16700:2004

Current
Current

The latest, up-to-date edition.

Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

09-29-2004

Publisher

British Standards Institution

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Image magnification
5 Reference material
6 Calibration procedures
7 Accuracy of image magnification and scale marker
8 Calibration report
Annex A (informative) - Reference materials for magnification
Annex B (informative) - Parameters that influence the resultant
        magnification of an SEM
Annex C (informative) - Uncertainties in magnification measurements
Annex D (informative) - Example of a test report
Bibliography

Provides a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material.

Committee
CII/9
DevelopmentNote
Supersedes 00/124017 DC. (10/2004) Supersedes 15/30317578 DC. (08/2016)
DocumentType
Standard
Pages
26
PublisherName
British Standards Institution
Status
Current
SupersededBy
Supersedes

Standards Relationship
ISO 16700:2016 Identical

PD 6699-1:2007 Nanotechnologies Good practice guide for specifying manufactured nanomaterials

ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
ISO 5725-1:1994 Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions
ISO Guide 35:2017 Reference materials Guidance for characterization and assessment of homogeneity and stability
ISO Guide 30:2015 Reference materials Selected terms and definitions
ISO Guide 34:2009 General requirements for the competence of reference material producers
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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Hardcopy - English
PDF - English
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