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BS ISO 19830:2015

Current
Current

The latest, up-to-date edition.

Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

11-30-2015

Publisher

British Standards Institution

Foreword
Introduction
1 Scope
2 Terms and definitions
3 Symbols and abbreviated terms
4 Reporting of relevant data acquisition parameters
5 Reporting of single-spectrum peak-fitting parameters
6 Multi-spectrum peak fitting
7 Satellite subtraction
8 Doublet subtraction
9 Spectrum deconvolution
10 Fit quality and uncertainties
Annex A (informative) - Example of reporting peak fitting
Annex B (informative) - Reporting peak fitting for multi-level
        data sets
Annex C (informative) - Template for reporting peak fitting
        parameters
Annex D (informative) - Statistical methods
Bibliography

Gives a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared.

The purpose of this International Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.

Committee
CII/60
DevelopmentNote
Supersedes 15/30300681 DC. (11/2015)
DocumentType
Standard
Pages
34
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
ISO 19830:2015 Identical

ISO 18115-1:2013 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
ISO 21270:2004 Surface chemical analysis X-ray photoelectron and Auger electron spectrometers Linearity of intensity scale

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Hardcopy - English
PDF - English
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