BS ISO 23830:2008
Current
The latest, up-to-date edition.
Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Hardcopy , PDF
English
12-31-2008
Foreword
Introduction
1 Scope
2 Symbols and abbreviations
3 Outline of method
4 Method for confirming the repeatability and constancy
of the intensity scale
4.1 Obtaining the reference sample
4.2 Preparation for mounting the sample
4.3 Mounting the sample
4.4 Choosing the spectrometer settings for which intensity
stability is to be determined
4.5 Operating the instrument
4.6 Measurements of the intensity and its repeatability
4.7 Calculating the intensity repeatability
4.8 Procedure for the regular determination of the constancy
of the relative-intensity scale
4.9 Next calibration
Annex A (informative) - Example of suitable operating conditions
for static SIMS
Bibliography
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