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BS ISO 29301:2017

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
Available format(s)

Hardcopy , PDF

Superseded date

10-26-2023

Language(s)

English

Published date

01-04-2018

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Image magnification
5 Reference materials
6 Calibration procedures
7 Accuracy of image magnification
8 Uncertainty of measurement result
9 Calibration report
Annex A (informative) - Parameters that influence
        the resultant magnification of a TEM
Annex B (informative) - Flowchart of image-magnification
        calibration procedure
Annex C (informative) - How to decide the number
        of lines for averaging
Annex D (informative) - Reference materials for
        magnification calibration
Annex E (informative) - Example of test report for
        calibration of TEM magnification
Bibliography

Defines a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM).

This document specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. This document is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. This document also refers to the calibration of a scale bar. This document does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM).

Committee
CII/9
DevelopmentNote
Supersedes 09/30179503 DC. (06/2010) Supersedes 17/30346182 DC. (01/2018)
DocumentType
Standard
Pages
54
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
ISO 29301:2017 Identical
ISO 29301:2010 Identical

ISO 16700:2016 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
ISO 5725-1:1994 Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions
ISO 17034:2016 General requirements for the competence of reference material producers
ISO Guide 35:2017 Reference materials Guidance for characterization and assessment of homogeneity and stability
ISO Guide 30:2015 Reference materials Selected terms and definitions
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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