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PD ISO/TS 18507:2015

Current
Current

The latest, up-to-date edition.

Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

07-31-2015

Publisher

British Standards Institution

Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions, symbols, and abbreviated terms
4 Background
5 Instrumentation
6 Specimen preparation
7 Data Collection and Storage
8 Data Analysis
9 Information required when reporting TXRF analysis
Annex A (informative) - Comparison of detection limits
        of TXRF, AAS, and ICP-MS
Annex B (informative) - Case studies of TXRF analysis
        for environmental applications
Annex C (informative) - Case studies of TXRF analysis
        for biological applications
Annex D (informative) - Theoretical derivation of relative
        sensitivity factors
Bibliography

Gives a framework on the uses of Total Reflection X-Ray Fluorescence (TXRF) spectroscopy for elemental qualitative and quantitative analysis of biological and environmental samples.

This Technical Specification provides a framework on the uses of Total Reflection X-Ray Fluorescence (TXRF) spectroscopy for elemental qualitative and quantitative analysis of biological and environmental samples. It is meant to help technicians, biologist, doctors, environmental scientists, and environmental engineers to understand the possible uses of TXRF for elemental analysis by providing the guidelines for the characterization of biological and environmental samples with TXRF spectroscopy.

Measurements can be made on equipment of various configurations, from laboratory instruments to synchrotron radiation beamlines or automated systems used in industry.

This Technical Specification provides guidelines for the characterization of biological and environmental samples with TXRF spectroscopy. It includes the following: (a) description of the relevant terms; (b) sample preparation; (c) experimental procedure; (d) discussions on data analysis and result interpretation; (e) uncertainty; (f) case studies; and (g) references.

Committee
CII/60
DocumentType
Standard
Pages
44
PublisherName
British Standards Institution
Status
Current

Standards Relationship
ISO/TS 18507:2015 Identical

DIN 51003:2004-05 Total reflection X-ray fluorescence analysis (TXRF) - Terminology and general principles
ISO 17331:2004 Surface chemical analysis Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
ISO 14706:2014 Surface chemical analysis Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
ISO 18115:2001 Surface chemical analysis Vocabulary

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PDF - English
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