BS QC 750102:1990

Withdrawn

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification

Available format(s)

Hardcopy , PDF

Withdrawn date

04-25-2012

Language(s)

English

Published date

02-15-1990

Publisher

British Standards Institution

NO CONTENTS SECTION

Ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS QC 750100.

Committee	EPL/47
DevelopmentNote	Also numbered as IEC 60747-7-1 (08/2005)
DocumentType	Standard
Pages	18
PublisherName	British Standards Institution
Status	Withdrawn

BS 6493-1.7:1989	Semiconductor devices. Discrete devices Recommendations for bipolar transistors
BS 6493-1.2:1984	Semiconductor devices. Discrete devices Recommendations for rectifier diodes
BS 9000(1967) : LATEST
BS 6493-3:1985	Semiconductor devices Mechanical and climatic test methods
BS 9970-0:1985	Harmonized system of quality assessment for electronic components. Semiconductor devices Generic specification
BS 3934:1965	Specification for dimensions of semiconductor devices and integrated electronic circuits
BS QC 750000(1986) : 1986	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION