Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

08-15-1992

Publisher

British Standards Institution

Committees responsible
National foreword
1. Scope and object
2. Apparatus
3. Procedure for integrated circuits
3.0 Introduction
3.1 Test conditions
3.2 Specified conditions
Figures

Tests to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

Committee	EPL/47
DevelopmentNote	Also numbered as IEC 60748-11-1 Supersedes 85/23858 DC (08/2005)
DocumentType	Standard
Pages	32
PublisherName	British Standards Institution
Status	Current

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