BS QC 410000:1990

National foreword
Committees responsible
Preface
Section One. Scope
1. Scope
Section Two. General
2. General
2.1 Related documents
2.2 Units, symbols and terminology
2.3 Preferred values
2.4 Marking
Section Three. Quality assessment procedures
3. Quality assessment procedures
3.1 Qualification Approval/Quality Assessment Systems
3.2 Primary stage of manufacture
3.3 Structurally similar components
3.4 Qualification approval procedures
3.5 Quality conformance inspection
3.6 Alternative test methods
3.7 Unchecked parameters
Section Four. Test and measurement procedures
4. Test and measurement procedures
4.1 General
4.2 Standard atmospheric conditions
4.3 Drying
4.4 Visual examination and check of dimensions
4.5 Continuity
4.6 Element resistance
4.7 Terminal resistance
4.8 Maximum attenuation
4.9 Resistance law (conformity)
4.10 Matching of the resistance law
4.11 Switch contact resistance
4.12 Voltage proof
4.13 Insulation resistance
4.14 Variation of resistance with temperature
4.15 Rotational noise
4.16 Contact resistance at low-voltage levels
4.17 Setting ability (adjustability)
4.18 Starting torque
4.19 Switch torque
4.20 End stop torque
4.21 Locking torque
4.22 Thrust and pull on spindle
4.23 Spindle run-out
4.24 Lateral run-out
4.25 Spigot diameter run-out
4.26 Spindle end play
4.27 Backlash
4.28 Dither
4.29 Output smoothness
4.30 Robustness of terminations
4.31 Sealing
4.32 Solderability
4.33 Resistance to soldering heat
4.34 Change of temperature
4.35 Vibration
4.36 Bump
4.37 Shock
4.38 Climatic sequence
4.39 Damp heat, steady state
4.40 Mechanical endurance (potentiometers)
4.41 A.C. endurance testing of mains switches on
      capacitance loads
4.42 D.C. endurance testing of switches
4.43 Electrical endurance
4.44 Component solvent resistance
4.45 Solvent resistance of the marking
Appendices
A. Rules for the preparation of detail specifications
      for capacitors and resistors for electronic
      equipment
B. interpretation of sampling plans and procedures as
      described in IEC Publication 410 for use within the
      Quality Assessment System for electronic components
C. A suitable method for measuring rotational noise,
      method A
D. Apparatus for measuring mechanical accuracy
Figures
1. Spindle sealed potentiometer
2. Spindle and panel sealed potentiometer
3. Container sealed potentiometer
4. Fully sealed potentiometer
5-7. Untitled
8. Output ratio
9. Loading error
10. Untitled
11. Conformity
12. Absolute conformity
13. Linearity
14. Independent linearity
15. Zero-based linearity
16. Absolute linearity
17. Terminal based linearity
18. Effective top width
19. Backlash
20-26. Untitled
27. Spindle run-out
28. Lateral run-out
29. Spigot diameter run-out
30. Spindle end play
31. Test circuit for measurement of backlash
32. Measurement of backlash
33. Test circuit for measurement of output smoothness
34-35. Untitled
36. Circuit for measurement of rotational noise,
      Method A