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BS QC700000(1991) : 1991

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
Available format(s)

Hardcopy , PDF

Superseded date

07-31-2011

Language(s)

English

Published date

01-01-1991

Committees responsible
National foreword
Specification
1 Scope
2 General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Preferred values of voltages, currents and
         temperatures
2.5 Marking
2.5.1 Terminal identification
2.5.2 Type designation
2.5.3 Manufacturer's name or trade mark
2.5.4 Inspection lot identification code
2.6 Categories of assessed quality
2.7 Screening
2.8 Handling
3 Quality assessment procedures
3.1 Eligibility for qualification approval
3.1.1 Primary stage of manufacture
3.2 Commercially confidential information
3.3 Formation of inspection lots
3.4 Structurally similar devices
3.5 Granting of qualification approval
3.6 Quality conformance inspection
3.6.1 Division into groups and sub-groups
3.6.2 Inspection requirements
3.6.3 Supplementary procedure for reduced inspection
3.6.4 Sampling requirements for small lots
3.6.5 Certified Records of Released Lots (CRRL)
3.6.6 Delivery of devices subjected to destructive or
         non-destructive tests
3.6.7 Delayed deliveries
3.6.8 Supplementary procedure for deliveries
3.7 Statistical sampling procedures
3.7.1 AQL (Acceptable quality level) sampling plans
3.7.2 Lot tolerance per cent defective (LTPD)
         sampling plans
3.7.3 Correlation between AQL and LTPD is specified
3.8 Endurance tests where LTPD is specified
3.9 Endurance tests where the failure rate is
         specified
3.9.1 General
3.9.2 Selection of samples
3.9.3 Failures
3.9.4 Endurance test time and sample size
3.9.5 Procedure to be used if the number of observed
         failures exceeds the acceptance number
3.10 Accelerated test procedures
3.10.1 Requirements for eligibility in periodic
         testing
3.10.2 Procedure for thermally-accelerated electrical
         endurance testing
3.10.3 Damp heat (under consideration)
3.10.4 Voltage (under consideration)
3.11 Capability approval
3.11.1 General
3.11.2 Terms and definitions
3.11.3 Procedure for granting capability approval
3.11.4 Capability approval maintenance procedure
3.11.5 Procedure for reduction, extension or change of
         capability approval
3.11.6 Procedure in case of deficiency in maintenance
         of the capability approval
3.11.7 Capability manual
3.11.8 Capability test programme
3.11.9 Verification of capability approval (quality
         audit)
3.11.10 Quality assurance of products delivered under
         capability approval
3.11.11 Marking and ordering information
3.11.12 Capability abstract for publication purposes
3.11.13 Detail specifications for custom components
3.11.14 Detail specifications for catalogue products
3.11.15 Detail specification register
4 Test and measurement procedures
4.1 Standard atmospheric conditions for electrical
         and optical measurements
4.2 Definition of a destructive list
4.3 Physical examination
4.3.1 Visual examination
4.3.2 Dimensions
4.3.3 Permanence of marking
4.4 Electrical and optical measurements
4.4.1 General conditions and precautions
4.5 Environmental tests
Appendices
A Lot tolerance per cent defective (LTPD)
         sampling plans
         Table A-I LTPD sampling plans
         Table A-II Hypergeometric sampling plans for
                      small lot sizes of 200 or less
         Table A-III AQL and LTPD sampling plans
B Dimensions to be checked
C Directions for applied forces for mechanical
         tests
D Assessment of quality levels in ppm (parts
         per million)

Forms part of the IEC Quality Assessment System for Electronic Components. This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. Covers order or precedence, related documents, units, symbols and terminology, preferred values of voltages, currents and temperatures, marking, terminal identification, type designation, manufacturer's name or trade mark, inspection lot identification code, categories of assessed quality, screening, handling, quality assessment procedures and test and measurement procedures.

Committee
EPL/47
DevelopmentNote
Supersedes 86/24762 DC and BS 9970-0(1985) (08/2005) Renumbered and superseded by BS IEC 60747-10. (08/2011)
DocumentType
Standard
Pages
40
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

BS QC 790131:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Complementary MOS digital integrated circuits (series 4000 B and 4000 UB)
BS QC 790132:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
BS QC 720106:1997 Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for avalanche photodiodes (APDs) with/without pigtail, for fibre optic systems or subsystems
BS QC 790130:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)
DEFSTAN 66-31(PT1)/2(2008) : 2008 BASIC REQUIREMENTS AND TESTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 1: INTRODUCTION AND GUIDE TO THE SPECIFICATION AND SELECTION OF TEST AND MEASUREMENT EQUIPMENT BY THE PROCURING AUTHORITY
DEFSTAN 66-31(PT1)/1(2007) : 2007 BASIC REQUIREMENTS & TESTS FOR ELECTRONIC & ELECTRICAL TEST & MEASUREMENT EQUIPMENT - PART 1: INTRODUCTION AND GUIDE TO THE SPECIFICATION AND SELECTION OF TEST AND MEASUREMENT EQUIPMENT BY THE PROCURING AUTHORITY
BS QC 790303:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC)
BS QC 790110:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits
BS QC 790111:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories
BS QC 750107:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications
BS QC 790202:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers
BS QC720101(1995) : 1995 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR LIGHT EMITTING/INFRARED EMITTING DIODES WITH/WITHOUT PIGTAIL FOR FIBRE OPTIC SYSTEMS AND SUB-SYSTEMS
BS QC 720105:1997 Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems
BS IEC 60747-12.1 : 1995 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR LIGHT EMITTING/INFRARED EMITTING DIODES WITH/WITHOUT PIGTAIL FOR FIBRE OPTIC SYSTEMS AND SUB-SYSTEMS
BS QC 720100:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices
BS QC 790304:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC)
BS QC 790104:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB
BS QC 750109:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
BS QC 720102:1997 Blank detail specification for laser diode modules with pigtail for fibre optic systems and subsystems
BS QC 750106:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
BS EN 190000:1996 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
BS QC 750113:1994 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A
BS QC 750104:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications
BS QC 790105:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories
EN 190000:1995 Generic Specification: Monolithic integrated circuits

BS 3934-3:1992 Mechanical standardization of semiconductor devices Recommendations for the preparation of outline drawings of integrated circuits
BS 6493-1.2:1984 Semiconductor devices. Discrete devices Recommendations for rectifier diodes
BS 3934-1:1992 Mechanical standardization of semiconductor devices Recommendations for the preparation of drawings of semiconductor devices
BS 6493-1.1:1984 Semiconductor devices. Discrete devices General
BS QC790100(1991) : 1991 AMD 10586 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
BS 6493-2.1:1985 Semiconductor devices. Integrated circuits General
BS 6493-1.5(1985) : 1985 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - RECOMMENDATIONS FOR OPTOELECTRONIC DEVICES
BS 6100-3.2.1:1984 Glossary of building and civil engineering terms. Services. Internal communication and transport Internal communication
BS 7151(1989) : AMD 7825 SPECIFICATION FOR REPRESENTATION OF DATES AND TIMES IN INFORMATION INTERCHANGE
BS 6493-3:1985 Semiconductor devices Mechanical and climatic test methods
BS 6493-2.2(1986) : 1986 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS
BS 6493-1.3:1986 Semiconductor devices. Discrete devices Recommendations for signal (including switching) and regulator diodes
BS 3934-2(1992) : 1992 AMD 13374 MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - SCHEDULE OF INTERNATIONAL DRAWINGS GIVING DIMENSIONS
BS 6493-2.3:1987 Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits

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