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BS QC 720100:1991

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices

Available format(s)

Hardcopy , PDF

Withdrawn date

04-25-2012

Language(s)

English

Published date

12-20-1991

Committees responsible
National foreword
Specification
1 Scope
2 General
2.1 Related document
2.2 Recommended values of temperature (preferred
       values)
2.3 Recommended values of voltages and currents
       (preferred values)
2.4 Terminal identification
3 Quality assessment procedures
3.1 Primary stage of manufacture and subcontracting
3.2 Structurally similar devices
3.2.1 Grouping for electrical and optical
       characteristic tests in Groups A and/or B
3.2.2 Grouping for environmental and mechanical tests
       in Groups B and/or C
3.2.3 Grouping for endurance tests
3.3 Inspection requirements for qualification
       approval
3.4 Quality conformance inspection
3.4.1 Division into groups and sub-groups
3.5 Group D tests
3.6 Screening
3.7 Sampling requirements
4 Test and measurement procedures
4.1 Light emitting diodes, infrared emitting diodes,
       general measurements
4.2 Photocouplers
4.3 Laser diodes
4.4 Photodiodes and phototransistors
4.5 Other devices (under consideration)
Appendices
A Structural similarity
B Dimensions
C Directions of applied forces for mechanical tests
Tables
I Group A: Lot by lot
II Group B: Lot by lot
III Group C: Periodic
IV Screening (under consideration)
V Sampling requirements for Group A tests
VI Sampling requirements for Group B and C tests, in
       which LTPD shall be used
Figures
1 Orientation of a cylindrical device to direction
       of applied force
2 Other type of package

Test and measurement procedures, inspection requirements together with associated screening and sampling requirements, and quality assessment procedures to be used in preparing detail specifications for optoelectronic devices in accordance with the appropriate blank detail specification.

Committee
EPL/47
DevelopmentNote
Supersedes 86/21275 DC (08/2005)
DocumentType
Standard
Pages
18
PublisherName
British Standards Institution
Status
Withdrawn

Standards Relationship
IEC 60747-12:1991 Identical

BS QC 720106:1997 Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for avalanche photodiodes (APDs) with/without pigtail, for fibre optic systems or subsystems
BS QC720101(1995) : 1995 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR LIGHT EMITTING/INFRARED EMITTING DIODES WITH/WITHOUT PIGTAIL FOR FIBRE OPTIC SYSTEMS AND SUB-SYSTEMS
BS QC 720105:1997 Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems
BS IEC 60747-12.1 : 1995 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR LIGHT EMITTING/INFRARED EMITTING DIODES WITH/WITHOUT PIGTAIL FOR FIBRE OPTIC SYSTEMS AND SUB-SYSTEMS
BS QC 720102:1997 Blank detail specification for laser diode modules with pigtail for fibre optic systems and subsystems

BS 6493-1.2:1984 Semiconductor devices. Discrete devices Recommendations for rectifier diodes
BS 3934-1:1992 Mechanical standardization of semiconductor devices Recommendations for the preparation of drawings of semiconductor devices
BS 6493-1.1:1984 Semiconductor devices. Discrete devices General
BS 6001-1:1991 Sampling procedures for inspection by attributes Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection
BS 6493-1.5(1985) : 1985 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - RECOMMENDATIONS FOR OPTOELECTRONIC DEVICES
BS 2011-2.2N:1977 Environmental testing. Guidance Test N. Guidance on change of temperature tests
BS QC 001002:1991 Rules of procedure of the IEC quality assessment system for electronic components (IECQ)
BS 6493-1.3:1986 Semiconductor devices. Discrete devices Recommendations for signal (including switching) and regulator diodes
BS 3934-2(1992) : 1992 AMD 13374 MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - SCHEDULE OF INTERNATIONAL DRAWINGS GIVING DIMENSIONS
BS QC700000(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS

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