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CEI EN 60679-1 : 2009

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
Available format(s)

Hardcopy , PDF

Superseded date

01-24-2019

Language(s)

English

Published date

01-01-2009

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and general information
4 Quality assessment procedures
Annex A (normative) - Load circuit for logic drive
Annex B (normative) - Latch-up test
Annex C (normative) - Electrostatic discharge sensitivity
        classification
Annex D (normative) - Digital interfaced crystal oscillators
        function
Bibliography
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

Defines general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as 'Oscillator'), of assessed quality using either capability approval or qualification approval procedures.

Committee
CT 309
DevelopmentNote
Classificazione CEI 309-1062. (08/2015) 2ED 2009 Edition is valid until 30-08-2020. (04/2018)
DocumentType
Standard
Pages
92
PublisherName
Comitato Elettrotecnico Italiano
Status
Superseded
SupersededBy

Standards Relationship
IEC 60679-1:2017 Identical
EN 60679-1:2017 Identical

IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
EN 60469:2013 Transitions, pulses and related waveforms - Terms, definitions and algorithms
EN ISO 80000-1:2013 Quantities and units - Part 1: General (ISO 80000-1:2009 + Cor 1:2011)
EN 61340-5-1:2016/AC:2017-05 ELECTROSTATICS - PART 5-1: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - GENERAL REQUIREMENTS (IEC 61340-5-1:2016/COR1:2017)
EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
IEC 61340-5-1:2016 Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
IEC 60469:2013 Transitions, pulses and related waveforms - Terms, definitions and algorithms
IEC TR 61000-4-1:2016 Electromagnetic compatibility (EMC) - Part 4-1: Testing and measurement techniques - Overview of IEC 61000-4 series
IEC 60749-27:2006+AMD1:2012 CSV Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
EN 60749-27:2006/A1:2012 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
ISO 80000-1:2009 Quantities and units — Part 1: General
IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits

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Hardcopy - English
PDF - English
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