CEI EN 60749-18 : 2004

Superseded

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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 18: IONIZING RADIATION (TOTAL DOSE)

Available format(s)

Hardcopy , PDF

Superseded date

11-15-2019

Language(s)

English

Published date

01-01-2004

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
1 Scope
2 Terms and definitions
3 Test apparatus
4 Procedure
5 Summary

Describes a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total close) effects from a cobalt-60 ([60]Co) gamma ray source.

Committee	CT 309
DevelopmentNote	Classificazione CEI 47-24 (04/2004) Supersedes CEI EN 60749. (05/2008)
DocumentType	Standard
Pages	20
PublisherName	Comitato Elettrotecnico Italiano
Status	Superseded
SupersededBy	CEI EN IEC 60749-18 : 2019
Supersedes	CEI EN 60749 : 2000 AMD 2 2004

Standards	Relationship
EN 60749-18:2003	Identical
IEC 60749-18:2002	Identical

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CEI EN 60749-18 : 2004

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 18: IONIZING RADIATION (TOTAL DOSE)

Table of Contents

Abstract

General Product Information

International Equivalents

Category

Subcategory