SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2004

Publisher

Comitato Elettrotecnico Italiano

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) - Normative
         references to international
         publications with their
         corresponding European
         publications

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.

Committee	CT 309
DevelopmentNote	Classificazione CEI 47-33. (01/2005) Supersedes CEI EN 60749. (05/2008)
DocumentType	Standard
Pages	12
PublisherName	Comitato Elettrotecnico Italiano
Status	Current
Supersedes	CEI EN 60749 : 2000 AMD 2 2004

Standards	Relationship
EN 60749-36:2003	Identical
IEC 60749-36:2003	Identical

EN 60068-2-7:1993

Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state

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CEI EN 60749-36 : 2004

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

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