SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2012

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Essential ratings and characteristic parameters
5 Test methods
Annex A (informative) - Geometries of BAW resonators
Annex B (informative) - Operation of BAW resonators
Bibliography

Explains terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and duplexer devices as radio frequency control and selection devices.

Committee	CT 309
DevelopmentNote	Classificazione CEI 47-93. (07/2012)
DocumentType	Standard
Pages	34
PublisherName	Comitato Elettrotecnico Italiano
Status	Current

Standards	Relationship
IEC 62047-7:2011	Identical
EN 62047-7 : 2011	Identical

IEC TS 61994-1:2007	Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators
IEC 60368-1:2000+AMD1:2004 CSV	Piezoelectric filters of assessed quality - Part 1: Genericspecification
IEC 60862-1:2015	Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60862-2:2012	Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60368-2-2:1996	Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters
IEC 61261-1:1994	Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
IEC 60368-2-1:1988	Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters
IEC 61261-2:1994	Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
IEC TS 61994-2:2011	Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters

View more information

US$172.07

Excluding Tax where applicable

Product format

I agree to the DRM document license rules apply against the PDF selection made.

Please confirm that you agree to the document license rules for this document.

I agree to the document license rules .

Please confirm that you agree to the document license rules for this document.

Access your standards online with a subscription

Features

Simple online access to standards, technical information and regulations.
Critical updates of standards and customisable alerts and notifications.
Multi-user online standards collection: secure, flexible and cost effective.

Learn more on subscription solutions

Get in touch with us

CEI EN 62047-7 : 2012

SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory